Electronic device test trolley

Abstract

The invention discloses an electronic device test trolley which comprises a trolley frame. The trolley frame is provided with multiple distance pieces and multiple stop pieces. The multiple distance pieces divide the trolley frame into multiple test regions used for containing electronic devices. The electronic device test trolley is characterized in that the trolley frame further comprises bases; the bases are used for supporting the electronic devices; each base is provided with a first end and a second end, wherein the first end and the second end are arranged from high to low; when placed on the trolley frame from the first ends, the electronic devices can slide to the second ends along the bases; and when sliding to the second ends, the electronic devices are limited through the stop pieces so as to stop sliding. Products to be tested can conveniently slide into the trolley smoothly from the feeding end through the obliquely-designed barrier bottom face, the above products do not need to be manually carried to the trolley by workers, and therefore the purpose of shortening the test time is achieved.

Description

technical field [0001] The invention relates to the field of liquid crystal display manufacturing, in particular to an electronic device testing trolley. Background technique [0002] With the progress and development of modern science and technology, more and more products adopt new materials and new processes. In order to meet the requirements of yield rate, many products must first undergo aging tests before leaving the factory. For example, liquid crystal displays are produced During the process, an aging burn-in test is usually carried out. A high-temperature and harsh environment is simulated in the aging room to test the stability and reliability of product performance. Common aging trolleys generally have insufficient capacity. It is inconvenient to observe the test screen and other problems, which causes inconvenience to the production process and also restricts production efficiency. [0003] The patent for invention with the application number CN201320407288.5 di...

AI Technical Summary

Problems solved by technology

[0002] With the progress and development of modern science and technology, more and more products adopt new materials and new processes. In order to meet the requirements of yield rate, many products must first undergo aging tests before leaving the factory. For example, liquid crystal displays are produced During the process, an aging burn-in test is usually carried out. A high-temperature and harsh environment is simulated in the aging room to test the stability and reliability of product performance. Common aging trolleys generally have insufficient capacity. It is inconvenient to observe the test screen and other problems, which causes inconvenience to the production process and also restricts production efficiency

[0003] The patent for invention with the application number CN201320407288.5 discloses an aging test frame for mobile phones or tablet computers, which is provided with several compartments in the vertical direction of the vehicle frame, and several vertical plates are vertically arranged on each compartment , so as to achieve the technical effect of being able to accommodate a large number of products to be tested, but because the bottom of the compartment of the frame is designed horizontally, it is not convenient for the operator to place the products to be tested on the frame, which increases the labor strength, reducing work efficiency

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