Weak-rigidity skin dimple hole depth measurement method, device, equipment and medium

A technology of depth measurement and weak rigidity, which is applied in the direction of measuring device, optical device, image analysis, etc., and can solve the problem of low measurement accuracy

Pending Publication Date: 2022-05-31
CHENGDU AIRCRAFT INDUSTRY GROUP
View PDF0 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of this application is to provide a method, device, equipment, and medium for measuring the depth of countersink holes in weakly rigid skins, aiming to solve the problem of low measurement accuracy in existing countersink hole measurement methods for complex skins with large curvature changes question

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Weak-rigidity skin dimple hole depth measurement method, device, equipment and medium
  • Weak-rigidity skin dimple hole depth measurement method, device, equipment and medium
  • Weak-rigidity skin dimple hole depth measurement method, device, equipment and medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0067] set the image acquisition times n;

[0068] The second binocular camera 120 is rotated around the axis vector of the countersink tool 130, and the rotation is obtained every 360° / n

[0072] D

[0073] In the formula, i=1, 2, 3, ..., n.

[0078] In this embodiment, after adjusting the first binocular camera 110 to a set position (ie, the spatial position), from

[0087] In this embodiment, before the first binocular camera 110 acquires the first image, the first binocular camera needs to be

[0090] Judging whether the effective depth of the countersunk hole is within the effective value range, if not, then alarm prompt.

Embodiment 2

Hole depth H={h

1

,h

2

,…,h

n

} and the current spot facing hole depth h, as well as the above calculation process data and calculations for all spot facing holes

Calculate the result.

[0101] The data display module is used to display the value of the depth of the countersunk hole through the display.

[0102] Alarm, for judging whether the spot hole depth H is within the effective value range, if not, then alarm prompt.

Embodiment 3

[0104] This embodiment provides a computer device comprising a memory and a processor, the memory

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a weak-rigidity skin dimple hole depth measurement method, device and equipment and a medium. The method comprises the following steps: acquiring a first image by using an adjusted first binocular camera; according to the first image, the real diameter D0 of the straight drill hole is obtained; the second to (n + 1) th images are obtained through the adjusted second binocular camera, and the central axis of the second binocular camera and the axial vector of the dimple tool are located on the same plane A; according to the second image to the (n + 1) th image, the conical surface height L = {l1, l2,..., ln} of the dimple hole is obtained, and the straight line length B = {b1, b2,..., bn} from the first intersection point to the second intersection point of the projection ellipse of the straight drilling hole and the plane A is obtained; according to the mapping relation between the real diameter D0 and the straight line length B, the depth H = {h1, h2,..., hn} of the dimple hole is obtained through the conical surface height L, and the minimum value of the depth H of the dimple hole serves as the effective depth of the dimple hole. The method has the advantages of being high in measurement precision and good in universality.

Description

A method, device, equipment and medium for measuring the depth of a weakly rigid skin spot facing socket technical field The application relates to the technical field of aircraft face-spot hole depth measurement, in particular to a kind of weak rigid skin face-spot hole depth Measurement methods, devices, equipment and media. Background technique [0002] The stealth effect and complex shape design of the aircraft put forward stricter requirements on the surface quality of the aircraft skin. airplane The skin structure is complex, and the lamination thickness varies greatly in different regions, which has typical weak rigidity characteristics. Current aircraft skins and Structural beams are mainly fastened and connected by countersunk rivets, and the depth deviation of the countersunk holes will directly cause the rivets to bulge or concave. It has become an important factor affecting the overall shape and stealth characteristics of the aircraft. [0003] With the d...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G01B11/22
CPCG06T7/0004G01B11/22G06T2207/10012
Inventor 隋少春黄伟许艾明王飞扬陈林
Owner CHENGDU AIRCRAFT INDUSTRY GROUP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap