Novel blanking and cutter connecting process
A new type of punching technology, applied in the field of new punching and splicing process, can solve problems such as affecting product quality and easily generating burrs at the splicing edge, and achieve the effect of reducing excessive burrs, ensuring a safe and efficient production environment and ensuring the production environment.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0022] In order to make the object, features and advantages of the present invention can be more obvious and understandable, the following in conjunction with the accompanying drawings of the specific embodiments of the present invention will be described in detail. Several embodiments of the present invention are given in the accompanying drawings. However, the present invention may be implemented in many different forms, and is not limited to the embodiments described herein.
[0023] In the present invention, unless otherwise expressly specified and qualified, the terms "installation", "connection", "connection", "fixed" and other terms should be understood broadly, for example, may be a fixed connection, may be a detachable connection, or integrated connection; It can be a mechanical connection or an electrical connection; It can be directly connected, indirectly through an intermediate medium, or it can be a communication within two components. For those of ordinary skill in ...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com