Abnormality detection method, device and equipment and storage medium

A technology of abnormal detection and configuration information, applied in the field of electronic information, it can solve problems such as heavy workload, slow problem solving, and difficult identification of risks, so as to shorten the cycle, improve the speed of solving, and meet the actual needs.

Pending Publication Date: 2022-06-07
LENOVO (BEIJING) CO LTD
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  • Abstract
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  • Claims
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Problems solved by technology

However, in some scenarios, the configuration items of different nodes are different
[0003] In this way, during the release process, if the risk due to profile factors is usually more difficult to identify
Usually, abnormal application functions or performance are disc

Method used

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  • Abnormality detection method, device and equipment and storage medium
  • Abnormality detection method, device and equipment and storage medium
  • Abnormality detection method, device and equipment and storage medium

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[0018] In order to make the purposes, technical solutions and advantages of the embodiments of the present application more clear, the specific technical solutions of the embodiments of the present application will be described in further detail below with reference to the accompanying drawings in the embodiments of the present application. The following examples are used to illustrate the present application, but are not intended to limit the scope of the present application.

[0019] In the following description, reference is made to "some embodiments" which describe a subset of all possible embodiments, but it is understood that "some embodiments" can be the same or a different subset of all possible embodiments, and Can be combined with each other without conflict.

[0020] In the following description, the term "first\second\third" is only used to distinguish similar objects, and does not represent a specific ordering of objects. It is understood that "first\second\third"...

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Abstract

The embodiment of the invention discloses an anomaly detection method and device, equipment and a storage medium, and the method comprises the steps: obtaining first configuration information of a target version; performing similarity comparison on the first configuration information and preset configuration information to obtain a first comparison result; obtaining a first similarity threshold value of the target version; and under the condition that the first comparison result does not meet a first similarity threshold value, determining that the first configuration information of the target version is abnormal.

Description

technical field [0001] The embodiments of the present application relate to the field of electronic information, and relate to, but are not limited to, an abnormality detection method, apparatus, device, and storage medium. Background technique [0002] During the application change process, the number of configuration item changes in the configuration file is small, and the configuration items in the same version and in the same cluster are roughly the same, that is, highly similar. However, in some scenarios, the configuration items of different nodes are different. [0003] In this way, it is often difficult to identify risks due to configuration file factors during the release process. Usually, the abnormal application function or performance is found first, and then the configuration file problem is gradually checked. The workload of checking the configuration file, especially the configuration file of the cluster environment, is very large, which also results in a lon...

Claims

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Application Information

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IPC IPC(8): G06F11/07G06F40/194G06F8/71G06K9/62
CPCG06F11/079G06F40/194G06F8/71G06F18/2433G06F18/22
Inventor 陆明王友焱
Owner LENOVO (BEIJING) CO LTD
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