Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Abnormality detection method, device and equipment and storage medium

A technology of abnormal detection and configuration information, applied in the field of electronic information, it can solve problems such as heavy workload, slow problem solving, and difficult identification of risks, so as to shorten the cycle, improve the speed of solving, and meet the actual needs.

Pending Publication Date: 2022-06-07
LENOVO (BEIJING) CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in some scenarios, the configuration items of different nodes are different
[0003] In this way, during the release process, if the risk due to profile factors is usually more difficult to identify
Usually, abnormal application functions or performance are discovered first, and configuration file problems are gradually checked, and because the workload of checking configuration files, especially cluster environment configuration files, is heavy, it also results in a long period of problem location and slow problem solving.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Abnormality detection method, device and equipment and storage medium
  • Abnormality detection method, device and equipment and storage medium
  • Abnormality detection method, device and equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] In order to make the purposes, technical solutions and advantages of the embodiments of the present application more clear, the specific technical solutions of the embodiments of the present application will be described in further detail below with reference to the accompanying drawings in the embodiments of the present application. The following examples are used to illustrate the present application, but are not intended to limit the scope of the present application.

[0019] In the following description, reference is made to "some embodiments" which describe a subset of all possible embodiments, but it is understood that "some embodiments" can be the same or a different subset of all possible embodiments, and Can be combined with each other without conflict.

[0020] In the following description, the term "first\second\third" is only used to distinguish similar objects, and does not represent a specific ordering of objects. It is understood that "first\second\third"...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention discloses an anomaly detection method and device, equipment and a storage medium, and the method comprises the steps: obtaining first configuration information of a target version; performing similarity comparison on the first configuration information and preset configuration information to obtain a first comparison result; obtaining a first similarity threshold value of the target version; and under the condition that the first comparison result does not meet a first similarity threshold value, determining that the first configuration information of the target version is abnormal.

Description

technical field [0001] The embodiments of the present application relate to the field of electronic information, and relate to, but are not limited to, an abnormality detection method, apparatus, device, and storage medium. Background technique [0002] During the application change process, the number of configuration item changes in the configuration file is small, and the configuration items in the same version and in the same cluster are roughly the same, that is, highly similar. However, in some scenarios, the configuration items of different nodes are different. [0003] In this way, it is often difficult to identify risks due to configuration file factors during the release process. Usually, the abnormal application function or performance is found first, and then the configuration file problem is gradually checked. The workload of checking the configuration file, especially the configuration file of the cluster environment, is very large, which also results in a lon...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F11/07G06F40/194G06F8/71G06K9/62
CPCG06F11/079G06F40/194G06F8/71G06F18/2433G06F18/22
Inventor 陆明王友焱
Owner LENOVO (BEIJING) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products