Loss test system for optical device for laser

Abstract

The invention discloses a loss test system of an optical device for a laser, and the system comprises a light source module, a multi-channel optical path connection module, an optical device connection module for the laser, and a loss test module, the output end of the light source module is connected with the input end of the multi-channel optical path connection module, and the output end of the multi-channel optical path connection module is connected with the output end of the multi-channel optical path connection module. The output end of the multi-channel optical path connecting module is connected with the input end of the optical device connecting module for the laser, and the loss testing module is arranged on the output end side of the optical device connecting module for the laser, and by adopting the technical scheme, the problems that in the related technology, the testing efficiency of testing the loss of the optical device for the laser is low and the like are solved.

Description

technical field [0001] The present application relates to the field of lasers, and in particular, to a loss testing system for optical devices used in lasers. Background technique [0002] With the development of laser technology, lasers are used more and more widely, and a large number of laser optical devices are generally integrated in lasers. In order to ensure the normal use of lasers, loss tests can be performed on these optical devices for lasers. The current technology generally adopts the method of testing the optical components of the laser one by one. Only the optical components of the laser to be tested can be spliced ​​in the test optical path for testing. After a laser optical component is tested, it needs to be disconnected from the test optical path. Then splicing the next optical device for the laser to be tested and continuing the test. In this way, the continuous splicing test is disconnected, which makes the test process complicated and wastes a lot of ti...

AI Technical Summary

Problems solved by technology

The current technology generally adopts the method of testing the optical devices for lasers one by one. The optical device for the laser to be tested can only be fused in the optical path of the test for testing. After the optical device for a laser is tested, it needs to be disconnected from the optical path of the test. Then weld the next laser optical device to be tested to continue the test, so that the continuous welding test and disconnection make the test process complicated and waste a lot of time on the switching of the laser optical device, resulting in low test efficiency.

[0003] Aiming at the low test efficiency of testing the loss of optical devices used in lasers in related technologies, no effective solution has been proposed yet

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