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Guided wave probe comprehensive test method and test platform

A technology of comprehensive testing and guided wave testing, which is applied to measuring devices, using sound waves/ultrasonic waves/infrasonic waves to analyze solids, and using sound waves/ultrasonic waves/infrasonic waves for material analysis, etc., can solve the problems of long test time and high test costs, and achieve reduction The effect of time cost, ensuring consistency, and improving the efficiency of comprehensive performance testing

Active Publication Date: 2022-08-09
GUANGDONG GOWORLD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Once the comprehensive performance test results of the guided wave probe do not meet the requirements, it is necessary to return to the factory to improve the guided wave probe, and then re-test the improved guided wave probe. The whole test process takes a long time and costs a lot.

Method used

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  • Guided wave probe comprehensive test method and test platform
  • Guided wave probe comprehensive test method and test platform
  • Guided wave probe comprehensive test method and test platform

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Experimental program
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Embodiment Construction

[0041] Further description will be given below in conjunction with the accompanying drawings and the preferred embodiments of the present invention.

[0042] like figure 1 As shown, a comprehensive test platform for guided wave probes includes a frame 1, a test rail 2, a comprehensive test block 3, two translation guide rails 4, a front guided wave probe frame 5, a rear guided wave probe frame 6, a water tank 7, a water tank The bracket 8, the probe base 9 and the probe adjustment mechanism 10; the test rail 2, the comprehensive test block 3 and the translation guide rail 4 are all arranged on the frame 1, and the two translation guide rails 4 are arranged in parallel on the test rail 2 and the comprehensive test block 3. On both sides of the test block 3, the center line of the comprehensive test block 3 and the center line of the test rail 2 are on the same line, and the top surface of the comprehensive test block 3 and the rail surface of the test rail 2 are at the same hei...

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Abstract

The invention relates to a guided wave probe comprehensive test method and a test platform. The method comprises a comprehensive performance test of a guided wave probe and a steel rail simulation guided wave test. The guided wave probe is firstly subjected to comprehensive performance testing, various conditions in on-site steel rail guided wave detection can be simulated, and the comprehensive performance testing efficiency of the guided wave probe is improved; when the guided wave probes meet the standard test data, the steel rail simulated guided wave test can be carried out on the spot, and each guided wave probe for carrying out the steel rail simulated guided wave test is ensured to be qualified; if the test data of the steel rail simulated guided wave test is qualified, the guided wave probe can be directly applied to field steel rail guided wave detection operation, performance detection on the guided wave probe is not needed on site, guided wave detection in a real steel rail flaw detection environment is simulated in a laboratory, the comprehensive performance test efficiency of the guided wave probe is improved, and the test cost is reduced. And the guided wave probe can be correspondingly improved according to the simulated guided wave detection result, so that the development and research of the guided wave probe are facilitated.

Description

technical field [0001] The invention relates to the technical field of ultrasonic flaw detection, in particular to a comprehensive testing method and a testing platform for a guided wave probe. Background technique [0002] After the design and development of the guided wave probe for rail detection is completed, it is necessary to conduct comprehensive performance tests including performance indicators such as center frequency and relative sensitivity. At present, after the completion of the guided wave probe, it is necessary to go to the outdoor site for actual inspection to judge its actual use effect. Inspection situation during rail inspection. Once the comprehensive performance test results of the guided wave probe do not meet the requirements, it is necessary to return to the factory to improve the guided wave probe, and then re-test the improved guided wave probe. The test time and cost of the entire test process are long. Therefore, it is very necessary to develop...

Claims

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Application Information

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IPC IPC(8): G01N29/04G01N29/265G01N29/30
CPCG01N29/04G01N29/265G01N29/30Y02E30/30
Inventor 陈志佳陈伟杰丁旭升付汝龙陈美君杨贵德
Owner GUANGDONG GOWORLD