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Displacement measurement system based on microwave interference and laser Doppler effect

A technology of Doppler effect and microwave interference, applied in the field of displacement measurement system based on microwave interference and laser Doppler effect, can solve the problems of small measurement range and low optical interference contrast, achieve wide application range and expand displacement measurement range, the effect of expanding the free spectral range

Pending Publication Date: 2022-08-09
CHONGQING UNIV
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Problems solved by technology

[0003] The invention provides a displacement measurement system based on microwave interference and laser Doppler effect to solve the problems of low optical interference contrast and small measurement range of current displacement measurement systems

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  • Displacement measurement system based on microwave interference and laser Doppler effect
  • Displacement measurement system based on microwave interference and laser Doppler effect
  • Displacement measurement system based on microwave interference and laser Doppler effect

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Embodiment Construction

[0049] In order for those skilled in the art to better understand the technical solutions in the embodiments of the present invention, and to make the above objects, features, and advantages of the embodiments of the present invention more clearly understood, the following describes the technical solutions in the embodiments of the present invention with reference to the accompanying drawings. for further details.

[0050] In the description of the present invention, unless otherwise specified and limited, it should be noted that the term "connection" should be understood in a broad sense. It is directly connected or indirectly connected through an intermediate medium. For those skilled in the art, the specific meanings of the above terms can be understood according to specific situations.

[0051] see figure 1 , is a schematic structural diagram of an embodiment of the displacement measurement system based on microwave interference and laser Doppler effect of the present inv...

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Abstract

The invention provides a displacement measurement system based on microwave interference and a laser Doppler effect, which comprises a laser generating device, a detection unit, an acquisition card, a static measurement unit and / or a dynamic measurement unit, and is characterized in that the static measurement unit comprises an attenuator and a static measurement branch; two output ends of the laser generating device are respectively connected with an input end of the detection unit, a first output end of the detection unit is connected with the acquisition card through the dynamic measurement unit, and a second output end of the detection unit is connected with the acquisition card through the static measurement branch. According to the invention, measurement is carried out by using microwave interference during static measurement, measurement is carried out based on Doppler effect during dynamic measurement, static measurement and dynamic measurement are combined, and the displacement measurement range and measurement precision can be ensured at the same time; the static displacement measurement and dynamic displacement integrated structure is simple, the application range is wide, the measurement precision is high, and the measurement range is large.

Description

technical field [0001] The invention belongs to the field of displacement measurement, in particular to a displacement measurement system based on microwave interference and laser Doppler effect. Background technique [0002] At present, when the displacement measurement is carried out in the space with limited high aspect ratio, the ordinary optical interference method is mostly used. Due to the limited space size, it is difficult to achieve the separation of transceivers. Therefore, the probe is usually aimed at the object to be measured, and the probe and the Interferometric measurement of the reflected light from the object surface. In order to improve the contrast of interference, it is necessary to coat the end face of the probe to increase the reflectivity, and for the test object with different surface reflectivity, it is necessary to replace the probe with different reflectivity on the end face, so that the reflectivity of the probe end face and the reflection of th...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/36G01S13/36G01S7/481
CPCG01S17/36G01S7/4814G01S7/4816G01S13/36
Inventor 邓明冯丹祺李中豪
Owner CHONGQING UNIV
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