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Method for bean hardening correcting original image recorded by CT Instrument

A technology of beam hardening correction and image, applied in the direction of material analysis using radiation, material analysis using wave/particle radiation, instruments, etc., can solve the problem of algorithm complexity and ineffectiveness

Inactive Publication Date: 2002-07-17
SIEMENS AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0024] Apparently the number of rays has no effect on the complexity of the algorithm

Method used

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  • Method for bean hardening correcting original image recorded by CT Instrument
  • Method for bean hardening correcting original image recorded by CT Instrument
  • Method for bean hardening correcting original image recorded by CT Instrument

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Embodiment Construction

[0042] exist figure 1 and 2 The middle table shows a third-generation multislice CT apparatus suitable for implementing the present invention. Whereby 1 generally represents the measuring device, which has: an X-ray source generally represented by 2, which has a ray stop 3 near its source front ( figure 2 ); and a plurality of detection elements (one of which is arranged in multiple rows and columns) figure 1Indicated by 4) the detection system 5 of a plurality of planar arrays formed, the system has a ray diaphragm 6 near the front of the detector ( figure 2 ). With the x-ray source 2 with the beam stop 3 on the one hand and the detection system 5 with the beam stop 6 on the other hand, they are used figure 2 The way shown in is arranged on a rotating frame 7 opposite to each other, that is, the pyramid-shaped X-ray beam emitted by the X-ray source 2 during the work of the CT instrument is incident on the detection device through an adjustable ray diaphragm 3. On the ...

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Abstract

A method for correcting for beam hardening in an initial CT image, which is composed of pixels arranged in a matrix, correction data are determined from the initial image by re-projection of the pixels from the initial image at a large number of projection angles, the pixels from the initial image being compared with a threshold value for each of the projection angles during the re-projection, and the re-projection being carried out for only those pixels from the initial image which have a pixel value above the threshold value. The correction data are used to determine a corrected image from the initial image.

Description

technical field [0001] The present invention relates to a kind of method that beam hardening correction is carried out to the original image that is combined with the pixels arranged in a matrix that are recorded with a CT instrument, and its steps are: [0002] According to the original image, the correction data is obtained by re-projecting the pixels of the original image under a plurality of projection angles, and when re-projecting each projection angle, the pixels of the original image are compared with a threshold value, and [0003] The correction data is used to derive a corrected image from the original image. Background technique [0004] Such methods are known, for example, from US Pat. No. 6,035,012 and US Pat. No. 4,217,641. [0005] Due to the spectral dependence of the radiation attenuation properties of real objects, in the case of polychromatic X-rays it will be observed that the average energy of the X-rays transmitted by the penetrat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): A61B6/03G01N23/04G06T1/00G06T5/00G06T11/00
CPCY10S378/901G06T5/006G06T11/006G06T2211/424G01N23/046G01N2223/419G06T5/80
Inventor 雷纳·劳帕克
Owner SIEMENS AG