Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Linear array CCD optical integral time self-adaptive control method and apparatus

A technology of self-adaptive control and integration time, which is applied in the control of exposure, optics, television, etc., can solve the problems that the measurement time is no longer applicable, the luminous intensity changes randomly, and cannot be effectively controlled, so as to overcome the adjustment range of light integration time, Overcoming the effect of rapid real-time measurement and overcoming image distortion

Inactive Publication Date: 2005-07-06
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
View PDF3 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0013] The invention solves the technical problem that the background technology is no longer applicable when the luminous intensity of the target or the background changes randomly and cannot be effectively controlled in the dynamic and real-time measurement while allowing the measurement time to be short.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Linear array CCD optical integral time self-adaptive control method and apparatus
  • Linear array CCD optical integral time self-adaptive control method and apparatus
  • Linear array CCD optical integral time self-adaptive control method and apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 2

[0086] The optical integration time adaptive control principle adopted in the second embodiment is as follows:

[0087] According to the CCD light integral charge formula

[0088] Q IP =ηqΔ neo AT C (1)

[0089] In the formula: η is the quantum efficiency of the material; q is the electronic charge; Δ neo is the photon flow rate of the incident light; A is the light-receiving area of ​​the photosensitive unit; T C is the light integration time. It can be seen from formula (1) that when the CCD is determined, for each pixel, η, q, and A are constants. Under the premise of constant illumination conditions, Δ neo is also a constant, so Q IP with T C into a linear relationship; and because Q IP The output amplitude of the pixel corresponding to the CCD is linear, so T C It is also a linear relationship with the output amplitude, that is:

[0090] U∝T C (2)

[0091] Where: U is the CCD output signal amplitude...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A line scan CCD optical integration time self-adaptive control method, which contains 1, estimating line scan CCD corresponded optical integration time according to relative parameter of line scan CCD output signal, 2, controlling line scan CCD driving time sequence generator according to estimated optical integration time and generating the driving pulse sequence needed in CCD normal work, said driving pulse sequence containing integration pulse sequence, transferring pulse sequence and reset pulse sequence, 3, line scan CCD output adjusted optical integration time signal by driving of pulse sequence, preprocessing and calculating said signal to extract correlation parameter of line scan CCD output signal, 4, comparing the correlation parameter of extracted CCD line scan output signal with preset threshold value, when the value is exceeds the threshold value, adjusting again by step 1, 2, 3, until the parameter is in preset threshold value range, 5, automatically completing adjustment of optical integration time.

Description

technical field [0001] The invention relates to a method and a device for adaptively controlling the light integration time of a linear array CCD. Background technique [0002] CCD is widely used in non-contact measurement, image sensing and storage. Linear array CCD has the characteristics of large number of pixels, small pixel size, fast speed, mature splicing technology, high measurement accuracy, and low price. For example, the TCD1500C produced by Toshiba Corporation of Japan has 5340 effective pixels, a pixel size of 7μm×7μm, and a maximum operating frequency of 20MHz. Due to the above characteristics, the linear array CCD is easy to realize high-precision measurement and positioning of one-dimensional size. [0003] In the actual measurement system, whether the dynamic range of the image matches the dynamic range of the CCD will have a great impact on the measurement accuracy of the system. Under the condition of a certain light integration time, if the light inten...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G03B7/08H04N5/335
Inventor 胡晓东谷林
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com