Rapid diagnosis testing system and method for computer hardware

A computer hardware and rapid diagnosis technology, applied in the detection of faulty computer hardware, program control devices, functional testing, etc., can solve problems such as lack of scalability and single test function, and achieve a good hierarchical structure and scalability. Effect

Inactive Publication Date: 2005-09-21
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF1 Cites 31 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The test function of the traditional computer hardware te

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Rapid diagnosis testing system and method for computer hardware
  • Rapid diagnosis testing system and method for computer hardware
  • Rapid diagnosis testing system and method for computer hardware

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] In the embodiment of the present invention, the test item refers to the corresponding name in the present invention of the computer hardware equipment that can carry out the diagnostic test, such as central processing unit (Central Processing Unit, CPU), optical drive (CDROM), modem (Modem) and so on.

[0014] In the embodiment of the present invention, each test item includes at least one test unit, and the test unit is the actual test content for the test item. For example, the test item CPU includes the following test units: CPU product number detection, CPU main frequency detection, CPU Bus frequency detection , CPU manufacturer identification detection, CPU trademark identification detection.

[0015] In the embodiment of the present invention, a test plan refers to a plan for a computer hardware diagnostic test generated by a user selecting a test item and a test unit according to a test requirement. A test plan may include multiple test items and multiple test un...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

This invention provides one computer hardware rapid diagnose system and method, which comprises three layers of structures: image user interface layer to provide interface with edit testing scheme, allocation test parameters and to execute test scheme and display test result information; dynamic connection database layer with several computer hardware dynamic connection database file to transfer the computer hardware driving program; device driving layer with several computer hardware driving programs to drive the hardware device and get the test result information.

Description

【Technical field】 [0001] The invention relates to a computer hardware diagnostic testing system and method, in particular to a computer hardware diagnostic testing system and method capable of customizing test items. 【Background technique】 [0002] Original Equipment Manufacturing (OEM) engaged in the production of computer hardware products, for the products produced, such as motherboard (Motherboard, M / B), central processing unit (Central Processing Unit, CPU), optical drive (CDROM), modem (Modem) etc. have very high quality requirements. Therefore, OEMs need to conduct a series of functional diagnostic tests on their computer hardware products to control the quality of their products before leaving the factory. [0003] Functional diagnostic testing has become a very important topic in the fields of motherboard production and computer system assembly. Traditional OEMs are often only engaged in the production of a single product, and the test systems they develop are only ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F9/44G06F11/26
Inventor 舒三一党德华翁意钦
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap