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Method for patterning a substrate surface

A substrate and patterning technology, which is applied in the direction of the device for coating liquid on the surface, the photolithography process of the patterned surface, and the process for producing decorative surface effects, etc., which can solve the problems of limited application and blurred parts

Active Publication Date: 2006-11-15
KONINKLIJKE PHILIPS ELECTRONICS NV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, this particular technique has many disadvantages
This dewetting step can leave ink marks on the contact surface of the imprinted raised parts, which can cause blurring of parts printed on the substrate
In addition, only a few hydrophilic ink solutions will show the desired dewetting effect on the imprint, which also limits the application of this technology.

Method used

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  • Method for patterning a substrate surface
  • Method for patterning a substrate surface
  • Method for patterning a substrate surface

Examples

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Embodiment Construction

[0015] It should be understood that the figures are only schematic and not drawn to scale.

[0016] According to the first step of the method of the present invention, there is provided a Figure 1a Elastic imprints as described in 10. The elastic imprint 10 has a raised member 14 extending from the body surface 12 of the elastic imprint 10 and a further raised member 14'. The protruding part 14 has a contact surface 16 and an edge 18 extending from the contact surface 16 to the body surface 12, while the other protruding part 14' has a contact surface 16' and an edge 18 extending from the contact surface 16' to the body surface 12. '. The body surface 12, edges 14 and 14' and contact surfaces 16 and 16' are covered with a barrier layer 20 through which the ink used on the elastomeric print 10 is impermeable. The barrier layer may also cover the other surfaces 22 and 24 of the elastic print 10, although this is not required. The raised part 16 and the further raised pa...

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Abstract

An elastomeric stamp (10) is provided, which has a bulk surface (12) from which protruding features (14, 14') extend. A barrier layer (20) covers the bulk surface (12) and the protruding features (14, 14'). After applying an ink solution to the elastomeric stamp (10) and drying the elastomeric stamp (10), the elastomeric stamp (10) is brought into contact with a surface (42) of a first substrate (40). The surface (42) of the first substrate (40) has a high affinity with the ink molecules (32), which is utilized to effectively remove the ink molecules (32) from the contact surfaces (16, 16') of the protruding features (14, 14'). Subsequently, the elastomeric stamp (10) is brought into contact with the surface (52) of a second substrate (50). Ink molecules 32 are transferred from the edges (18, 18') of the protruding features (14, 14') to the surface (52) of a second substrate (50), thus forming an ink pattern in the form of a selfassembled monolayer on this surface (52). The patterning method of the present invention allows for the formation of high-definition ink patterns on a substrate (50) using a wide variety of inks.

Description

technical field [0001] The present invention relates to a method of patterning the surface of a substrate with ink. Background technique [0002] Typically, microscopic patterns of devices including electronic devices are formed using photolithographic steps that include masks to define these patterns on the substrate of the electronic devices. However, as predicted by Moore's Law, as the semiconductor feature size shrinks, the patterns formed on the substrate become increasingly complex, which usually results in the need for a greater number of masks, which are expensive processes to produce, This further increases the production costs of the electronic device. In addition, the foregoing conventional photolithographic techniques are generally considered to have matured to such an extent that further reductions in feature size on electronic device substrates using these techniques would be difficult to achieve. [0003] Alternative techniques for patterning electronic devi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B81C1/00B05D1/28B82B3/00G03F7/00
CPCB05D1/283B82Y10/00B82Y30/00B82Y40/00G03F7/0002B81C1/0046
Inventor D·布尔丁斯基R·B·A·夏普
Owner KONINKLIJKE PHILIPS ELECTRONICS NV