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Programming method for once programmable memory of integrated circuit

An integrated circuit and memory technology, applied in the field of one-time programmable memory, to achieve the effect of reducing production costs, reducing costs and saving components

Inactive Publication Date: 2006-12-27
FUXIANG MICROELECTRONICS SHENZHEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Usually, the capacity of the system memory will have a large blank area after storing the instruction set. In the normal operation mode, these blank areas will not be used and will be wasted.

Method used

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  • Programming method for once programmable memory of integrated circuit
  • Programming method for once programmable memory of integrated circuit

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Embodiment Construction

[0029] The present invention will be described in further detail below through specific embodiments and in conjunction with the accompanying drawings.

[0030] Please refer to FIG. 1 , which illustrates a structural diagram of an integrated circuit 100 according to a specific embodiment of the present invention. The integrated circuit 100 includes a microprocessor 101 , a cycle generator 105 , a serial programming interface 107 , a multiplexer 109 and a system memory 111 , wherein the microprocessor 101 includes a programming interface 103 . The microprocessor 101 is connected to the system memory 111 via the programming interface 103 and the multiplexer 109, the serial programming interface 107 is connected to the system memory 111 via the multiplexer 109, and the microprocessor 101 is further connected to a cycle generator 105. The processor 101 must execute instructions according to the frequency cycle generated by the cycle generator 105 . The system memory 111 adopts one...

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Abstract

The invention relates to a programming method of one-time programmable memory of integrated circuit, wherein said memory can use two write modes to write instruction group or standard parameter, to simplify the internal structure of integrated circuit; and the standard parameter is written into system memory to utilize the space effectively; and the integrated circuit operator can avoid write correct parameter based on different applications, to improve the producing efficiency and reduce cost. The invention can avoid addition external memory element and reduce the cost of electric tester. And the inventive testing circuit can record correct parameter by itself, to simplify the process and reduce the cost.

Description

【Technical field】 [0001] The invention relates to an integrated circuit, in particular to a method for programming one-time programmable memory (OTPMemory). 【Background technique】 [0002] Currently, known integrated circuit structures for measurement include an analog-to-digital converter (ADC), a microprocessor (MCU), and system memory. The MCU includes a random access memory (RAM), a central computing unit (CPU), a programming interface, and the like. [0003] When the integrated circuit is applied to the measuring device, the sensor (sensor) such as pressure and weight is in contact with the signal to be measured, and the sensor converts the physical quantity of the signal to be measured into an electrical signal (voltage or current), and the electrical signal is detected by the integrated circuit. The analog-to-digital converter converts it into a digital signal, which is calculated, processed or further converted by the MCU, and displayed on an external display. Howe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F12/02G01D3/02
CPCY02B60/1225Y02D10/00
Inventor 赵伯寅林祥民袁国元
Owner FUXIANG MICROELECTRONICS SHENZHEN
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