Energy efficient construction surfaces
A technology of outer surface and reflective layer, applied in the direction of building, sustainable building, building structure, etc., can solve problems such as loss of reflectivity
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test approach 1
[0045] Reflectance measurements were performed using a Perkin Elmer Lambda 900 spectrophotometer equipped with a PELA-1000 integrating sphere accessory. The ball has a diameter of 150 mm (6 inches) and complies with ASTM methods E903, D1003, and E308 contained in "ASTM Standards on Color and Appearance Measurement" (Third Edition), published by ASTM in 1991. Optical diffuse reflectance (DLR) is measured in the 250-2500nm spectral range. UV-Vis integration was set at 0.44 seconds. The slit width is 4 nm. Use a "trap" to eliminate problems caused by specular reflectivity.
[0046] All measurements were performed with a clean, optically flat fused silica (quartz) plate placed in front of the sample or a standard white plate. A cup with a diameter of about 50 mm and a depth of about 10 mm is filled with the particles to be characterized.
test approach 2
[0048] The L * a * b * For colour, the use of traversing rollers is to ensure an even level of preparation for measurement. The container is filled to a depth of about 5 mm to ensure that the measured value is due to the particles. For a more detailed description of sample containers and sample preparation, see US Patent No. 4,582,425.
test approach 3
[0050] The particles to be tested are sieved to obtain a size class which passes through a 16 mesh and remains on a 20 mesh US Standard sieve drum. Measure 15 g of sieved granules in a 31 mm diameter open cup (Spex CertiPrep, Metuchen, NJ, USA) with polyethylene split ring and adjustment ring initial copper content. The bottom of the assembled sample cup was lined with a 0.2 mil (5 micron) thick, 2 7 / 8 inch (7.3 cm) wide polypropylene window film (Spex CertiPrep, Metuchen, NJ, USA) . Taking care not to tap or otherwise cause the particles to rearrange in the cup, place the cup on the probe of an XMET880 X-ray fluorescence (XRF) instrument equipped with a surface analysis probe (produced by Metorex, Ewing, NJ, USA). , the surface analysis probe is immobilized with a 60 mCi Cm-244 excitation source. The sampling time was set to 20 seconds. The instrument has been calibrated with a series of particles of known copper content and data are reported in grams per metric ton.
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