Integrated Circuit Including a Programmable Logic Analyzer with Enhanced Analyzing and Debugging Capabilities and a Method Therefor

Abstract

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment of the present invention, an embedded logic analyzer (ELA) receives a plurality of signals from a plurality of buses within an integrated circuit (IC). The ELA includes an interconnect module to select a trigger signal and / or a sampled signal from the plurality of received signals. A trigger module sets at least one trigger condition and detects if the trigger signal satisfies the at least one trigger condition. When the trigger condition is satisfied, an output module performs at least one task based upon the satisfied at least one trigger condition. If a sampling process is initiated by the output module, the plurality of sampled signals is sampled and may be stored in a memory. The capability of the output module to perform multiple user-defined tasks enhances the debugging capability of the ELA and makes it more versatile.

Description

CROSS REFERENCE TO RELATED APPLICATION[0001]Pursuant to 37 C.F.R. §1.78, this application is a continuation application and claims the benefit of the earlier filing date of U.S. application Ser. No. 12 / 877,819, filed Sep. 8, 2010, entitled “An Integrated Circuit Including a Programmable Logic Analyzer with Enhanced Analyzing and Debugging Capabilities and a Method Therefor,” which itself is a continuation-in-part application and claims the benefit of the earlier filing date of U.S. application Ser. No. 12 / 542,976, filed Aug. 18, 2009, entitled “An Integrated Circuit Including a Programmable Logic Analyzer with Enhanced Analyzing and Debugging Capabilities and a Method Therefor.” The content of each of the above applications is hereby incorporated by reference as if fully set forth herein.BACKGROUND[0002]1. Field of the Invention[0003]The present invention relates generally to an embedded logic analyzer, and particularly to a programmable embedded logic analyzer for analyzing an elec...

AI Technical Summary

Benefits of technology

The present invention provides an improved logic analyzer that can effectively test and bug fix a system. The logic analyzer has a first input to receive signals and a first output to provide selected samples of the signals. A first block is coupled to the logic analyzer to receive and modify the signals based on a predetermined function. This added flexibility allows for efficient testing at both the system and subsystem levels. Additionally, the system includes an embedded logic analyzer block that detects and responds to events based on the signals. This output provides a more efficient mechanism for sampling and storing system data. Overall, the invention improves the testing and debugging of systems.

Problems solved by technology

However, conventional ELAs are limited to sampling when the trigger condition is satisfied.

Further, conventional ELAs do not capture, analyze, and / or debug software data or firmware data signals within the IC, and additional instrument(s) may be necessary in order to analyze these types of data.

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