Apparatus and methods for measuring permeability and conductivity in materials using multiple wavenumber magnetic interrogations

a technology of magnetic interrogation and apparatus, applied in the field of magnetic interrogation of materials, can solve the problem of limited use of these sensors

Inactive Publication Date: 2000-12-12
MASSACHUSETTS INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The techniques described herein are referred to as an "imposed .omega.-k" approach to magnetometry. A spatially periodic field is imposed upon the material via a coil structure under the control of a wavenumber controller. The coil structure can be near the material surface or embedded. The properties of the material are reflected in the measurement of the current or voltage induced in the sensing coils in response to this field. By varying the wavenumber, k, a spatial distribution of complex permeability and conductivity is deduced

Problems solved by technology

However, the utility of these sensors typically is limited by their inabi

Method used

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  • Apparatus and methods for measuring permeability and conductivity in materials using multiple wavenumber magnetic interrogations
  • Apparatus and methods for measuring permeability and conductivity in materials using multiple wavenumber magnetic interrogations
  • Apparatus and methods for measuring permeability and conductivity in materials using multiple wavenumber magnetic interrogations

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Embodiment Construction

In conventional magnetometry, the temporal frequency response is used to study the magnetic and electrical attributes of the materials, such as can be discerned through the effect on the fields of molecular and domain-level magnetization and ionic and electronic conduction. In the conventional measurement of complex permeability, a toroid of the material would typically be used. An N turn winding wrapped around the toroid is then driven by a current, i.sub.1, and the complex permeability of the material is reflected in the flux linkage, .lambda..sub.1. This toroid should have a major radius that is large enough compared to the minor cross-sectional dimensions of the toroid that the fields induced in the material are essentially uniform over the cross-sectional area, A, of the toroid. The response to a sinusoidal drive having the frequency .omega. can be defined as the complex inductance ##EQU1## where .lambda..sub.1 and i.sub.1 are the complex amplitudes of the flux linkage and curr...

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Abstract

Devices and analytical techniques are disclosed for measuring spatial profiles of complex permeability and conductivity of a material by multiple wavenumber interrogations. Coil array structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals (of temporal frequency " omega ") from the coil array structures are attenuated by varying degrees in the material undergoing analysis, depending on the wavenumber ("k"), thereby permitting the derivation of composite complex permeability/conductivity profile.

Description

BACKGROUND OF THE INVENTIONThe technical field of this invention is magnetometry and, in particular, the spatial interrogation of materials to deduce their physical properties from measurements of complex permeability and conductivity.Magnetometers or arrays of coils have been used for noninvasive measurement of kinematic and physical properties of conducting materials. For example, eddy current sensors have been used to measure the thickness of conducting strips, as disclosed in Soviet Patents 573,609 and 502,205. Another use of such eddy current sensors has been in flaw detection, as disclosed in U.S. Pat. No. 3,939,404. However, the utility of these sensors typically is limited by their inability to provide enough information to resolve distributions of parameters.There exists a need for better permeability / conductivity measuring devices and methods. In particular, there exists a need for better devices and methods for conducting non-destructive interrogations of materials to det...

Claims

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Application Information

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IPC IPC(8): G01N27/72G01R27/26
CPCG01R27/2635G01N27/72
Inventor MELCHER, DECEASED, JAMES R.
Owner MASSACHUSETTS INST OF TECH
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