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A testing system and method

A test method, test system technology

Inactive Publication Date: 2009-06-10
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] The present invention provides a test system and method to solve the problem in the prior art that the measurement cannot be guaranteed once the board under test enters a stable working state

Method used

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  • A testing system and method
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  • A testing system and method

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Embodiment Construction

[0047] In order to make those skilled in the art better understand the present invention, the present invention will be described in further detail below in conjunction with accompanying drawing and embodiment:

[0048] First refer to figure 2 , figure 2 It is a connection block diagram of the test system of the present invention:

[0049] The test system in the embodiment of the present invention is composed of test equipment 21 , test resource equipment 23 and control equipment 22 .

[0050] One end of the test device 21 is connected to the board under test 24 to complete the test of the output physical quantity (such as power) of the board under test 24 and transmit the test data to the control device 22 .

[0051] The control device 22 controls the test device 21 to test through the interface 1, and receives the test data output by the test device 21; the control device 22 controls the test resource device 23 through the interface 2 to provide the board under test 24 w...

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Abstract

This invention provides a test system and a method, in which, the system should be preheated for a time before entering into the stable working state including: a test device, a test resource device and control device. The method includes: initializing the test system to let the test plate enter into working state and output signals to let the test device enter into the test state and carry out test to write the result into the FIFO sequence, judging if the test plate has entered into a stable working state, and outputting the final test result if so.

Description

technical field [0001] The invention relates to the field of radio frequency testing, in particular to a testing system and method, in particular to a method for automatically controlling test delay in an automatic testing system. Background technique [0002] In the field of radio frequency testing, there are usually a large number of active components inside the test instrument and the board under test, such as amplifiers and local oscillators. These active components can work stably after being turned on for a period of time. In order to avoid the influence of the instability of the instrument itself on the test accuracy and consistency, it needs to be warmed up for a period of time before it can be used normally. The standard warm-up time for general instruments is 30 minutes. For the board under test, it also needs sufficient warm-up time to enter a stable working state, and the measured value can truly reflect the actual working ability of the board under test. Howev...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00H04M3/22H04Q1/20G01R31/28
Inventor 吴祥
Owner HUAWEI TECH CO LTD