Device and method for testing clock or signal driving load capacity

Abstract

The present invention provides a device and a method for testing the clock or signal drive loading capability. The device at least comprises a loading unit, a monitoring and control unit, and a person-machine interface, wherein the loading unit comprises a selecting module and an analog loading module, and connects with a tested object and the monitoring and control unit; the monitoring and control unit comprises a monitoring unit and an analysis control module, the monitoring and control unit is connected with the loading unit and the person-machine interface, of which the monitoring unit comprises a performance value acquisition module and a calculating index module; and the person-machine interface comprises a result display module and an input module, and connects with the monitoring and control unit. The device and the method of the present invention can automatically test the loading capacity of the tested object and the parameters of the measured signals under the circumstance of sundry loading; and assess the extreme drive capability of the tested signal. The device is of more authenticity than an EDA tool, which is favorable for improving the reliability and stability of products. At the same time, using the device and the method saves time and labor, and can improve the working efficiency and conduce to the shortening of the product development period.

Description

technical field [0001] The invention relates to the field of signal quality and signal sequence testing in digital systems, in particular to a device and method for testing clock or signal driving load capacity. Background technique [0002] In a digital system, the output terminals of a gate circuit are generally connected to the input terminals of other gate circuits, which is called a load. A gate circuit is allowed to carry several load gates of the same type at most, which is its load capacity, or its drive. ability. The indicators to measure the signal driving ability are generally divided into two aspects: dynamic performance and static performance. Dynamic performance refers to the rise / fall time of the driving signal; and static performance refers to the level value of the driving signal. The driving capability of the signal is generally determined by the chip itself. Insufficient driving ability: the level amplitude cannot go up or down, and the edge is slow. T...

AI Technical Summary

Problems solved by technology

However, if it is an interface signal between printed circuit boards (PCB), the simulation tool cannot effectively evaluate the driving capability of the driving signal.

In the product development stage, it is difficult to provide enough resources to test the actual driving ability of the driving signal, especially the test of the driving ability limit value

At present, it is only in the system test or even the actual application that the driving ability of this signal can be detected to meet the requirements, which has brought unfavorable factors to the reliability and stability of the product.

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