Method for measuring the scattering parameters of a multiport apparatus with non-sinusoidal measurement signals
A technology for measuring signals and scattering parameters, applied in the direction of measuring electrical variables, measuring devices, measuring resistance/reactance/impedance, etc., which can solve problems such as reducing measurement accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0013] figure 1 shows a circuit diagram of a conventional vector network analyzer with two measurement ports P1 and P2, to which a frequency-varying high-frequency measurement signal supplied by a generator G can be selectively connected via a converter U . The directional coupler R1 is installed in a measurement branch I through which a measurement signal m1 corresponding to the forward moving waveform parameter a1 and a measurement signal m2 corresponding to the returning waveform parameter b1 can be measured. By means of the directional coupler R2 in the second measurement branch II, a measurement signal m3 corresponding to the wave b2 leaving the device X under test and a measurement signal m4 corresponding to the wave a2 transmitted to the device X under test can be measured. The measurement signals m1 to m4 are supplied via the measurement channels K1 to K4 to the evaluation device A of the network analyzer, in which these measurement signals are scanned by e.g. analog / ...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 