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Nano width resonance structure on silicon sheet of SOI and preparation process thereof

A technology of silicon on insulator and resonant structure, which is applied in nanostructure manufacturing, nanotechnology, nanotechnology, etc., can solve the problems of expensive equipment, low processing capacity, and unsuitability for mass production, and achieve easy mass production and rough surface low degree of effect

Inactive Publication Date: 2009-08-12
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The main disadvantages of advanced processing technologies such as electron beam lithography and FIB are low processing capacity, not suitable for mass production, and very expensive equipment
In addition, the existing dry etching technology with high control precision generally forms a lattice damage layer with a thickness of tens of nanometers on the surface of the nanobeam, which seriously affects the mechanical and electrical properties of the nanobeam.

Method used

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  • Nano width resonance structure on silicon sheet of SOI and preparation process thereof
  • Nano width resonance structure on silicon sheet of SOI and preparation process thereof
  • Nano width resonance structure on silicon sheet of SOI and preparation process thereof

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Embodiment 1

[0029] The resonant structure of nanometer width on the SOI silicon wafer described in the present invention is as figure 1shown. The nano-beam 1 is supported by the anchor point 2, and there is a pair of electrodes 3 on both sides of the nano-beam 1, and a metal pad 4 is made on the anchor point 2 and the electrode 3, and the nano-beam structure is made on an SOI silicon wafer. Described SOI silicon wafer is a kind of silicon wafer of three-layer structure, and lower layer is substrate layer 5, and middle layer is silicon dioxide buried layer 6, and upper layer is monocrystalline silicon layer 7, and the upper surface of the upper layer silicon that uses is (110 ) crystal plane, the nanobeam 1, the anchor point 2 and the electrode 3 are all manufactured on the upper silicon layer 7 of the SOI silicon wafer of the (110) crystal plane. The silicon dioxide buried layer 6 under the nano-beam 1 is removed by local corrosion, so it can vibrate freely. The width of the nano-beam is...

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Abstract

A nano-width resonance structure on the SOI (Silicon-on-insulator) silicon chip features that the anisotropic wet corrosion characteristic of the silicon chip with crystal orientation (110) is used, the includes angle between mask pattern and crystal orientation is precisely controlled, the crystal orientation can be automatically corrected by anisotropic wet corrosion, the low-speed corrosion can decrease width, and the concentrated B solution can automatically stop the corrosion to control the form of anchor point and drive electrode. After a nano-beam whose width is less than 100 nm is prepared, the drive / sensing electrode are prepared at its both sides to obtain the nano resonance structure.

Description

technical field [0001] The invention relates to a nanometer-width resonant structure on a silicon-on-insulator (SOI) silicon wafer based on anisotropic etching technology and a manufacturing method thereof, more precisely a kind of SOI silicon wafer on a (110) crystal plane The invention discloses a single crystal silicon nano-beam resonant structure with a width less than 100nm and a manufacturing method thereof, belonging to the field of micron / nano processing. Background technique [0002] Nano-Electro-Mechanical-System technology (Nano-Electro-Mechanical-System, NEMS) is an important part of nanotechnology [A.N.Cleland, Foundations of Nanomechanics.ISBN] through the integration of nano-devices and micro-devices, circuits using nano-effects to achieve significant improvement in device performance 3-540-43661-8, Springer-Verlag Berlin Heidelberg 2003.]. Nanoresonant structure is one of the basic structures of nanoelectromechanical devices, and is the core structure of var...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B82B3/00B82B1/00
Inventor 杨恒许科峰李铁焦继伟李昕欣王跃林
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI