Calibration method for object surface three-dimensional contour structure light measurement system

Abstract

The invention discloses a calibration method of an optical measuring system of three-dimensional outline structure of an object surface and belongs to the technical field of three-dimensional measuring methods and instruments. The calibration method of the optical measuring system of three-dimensional outline structure of the object surface consists of the followings steps: (1) a black-and-white camera is calibrated; (2) a projector is calibrated; (3) parameters required by a whole system are obtained by a multi-plane calibration method; and the calibration method of the optical measuring system of three-dimensional outline structure of an object surface is characterized in that (4) a target board is a color target board, and the foreground color and the background color of the target board are two colors that have the same reflectivity to the black-and-white camera; (5) in the step (1) of black-and-white camera calibration, a color light that has the same color with one of the foreground color and the background color of the target board is projected onto the target board. Compared with traditional methods that use a black-and-white target board, the calibration method of the optical measuring system of three-dimensional outline structure of the object surface has higher stability and reliability, improves calibration precision, and plays a vital role in the precise measurement aspect of the three-dimensional outline structure of the object surface.

Description

Technical field [0001] A calibration method for a three-dimensional profile structured light measurement system on an object surface relates to the field of computer vision measurement, belongs to the technical field of three-dimensional measurement methods and instruments, and in particular relates to the calibration occasion for a structured light measurement system. Background technique [0002] The three-dimensional measurement technology of objects should be very common in the fields of product design and manufacturing, quality inspection and control, robot vision, etc. Structured light measurement technology is a very important and promising branch of 3D measurement technology. Accurate calibration of the measurement system is the prerequisite and key condition for the system to be accurately reconstructed. The calibration of the measurement system is to obtain the geometric and optical characteristics inside the camera and projector, that is, the internal parameters, ...

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Problems solved by technology

From the above method, it is found that in the calibration of the projector, the position of the target is guaranteed to be known, the projector projects the image, and the camera collects the image, that is, the target point on the target is used for the calibration of the camera and the projector at the same time, and is used for the camera and projection. The calibration pattern of the projector is different, so when the coding mode is projected on the traditional black and white target pattern for projector calibration, the collected target image will be affected by the target pattern used to calibrate the camera, and a good target pattern cannot be obtained, seriously The influence of the calibration accuracy

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