Nano material drawing device in scanning electron microscope driven by piezoelectric ceramic piece

Abstract

A nanometer material stretching device in a scanning electron microscope driven by a piezoceramics plate belongs to the testing field of a nanometer material original position. The invention includesa base (1) and an insulating supporting seat (2) with two grooves. The two grooves are respectively fixed at one end of the two metal slices (3). The two sides of the metal slices are respectively stuck with two piezoceramics plates(4) and simultaneously the other end of each metal slice is respectively fixed with two sample platforms(5), is connected with a power cathode by an electrode leader I(7) and is connected with an anode by an electrode leader II (8); the electrode leader I (7) is respectively connected with the two metal slices (3); the electrode leader II (8) is respectively connected with four piezoceramics plates(4); the two sample platforms are arranged in a same horizontal plane and a narrow gap between the platforms is between 2 to 50 Mum. The nanometer material stretchingdevice has low cost and is simple and convenient for operation, can measure the charge transport characteristic during the stress straining process of the nanometer material, and provide reliable data for the nanometer material in the fields like a micro-electromechanical system.

Description

technical field [0001] The invention relates to a device for in-situ stretching of nanomaterials in a scanning electron microscope (hereinafter referred to as scanning electron microscope) driven by a piezoelectric ceramic sheet. Electron microscopy can observe the structural changes of nanomaterials during tensile deformation in real time, revealing the deformation mechanism and brittle-ductile transition mechanism of nanomaterials under tensile load. At the same time, an electrode can be added on it to measure the change of the conductance property of the nanomaterial during the deformation process, which belongs to the field of in-situ testing of the mechanical / electrical properties of the nanomaterial. Background technique [0002] One-dimensional nanomaterials (including: nanowires, nanotubes, nanobelts, nanorods, etc.) The incomparable mechanical properties of bulk materials, for example, the superplasticity of a nanomaterial under stress, and the fracture mechanism o...

AI Technical Summary

Problems solved by technology

This method puts a complex structure into the sample chamber of the transmission electron microscope, which limits the large-angle tilt of the sample stem, and cannot observe changes in the atomic-scale microstructure of the sample that needs to be observed under the positive band axis, which is not conducive to the development of the method. to promote

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