Method and system for supplying combinations of clock frequency, voltage, and current to processors

Abstract

Combinations of clock frequencies, voltages, and currents at which a processor operates normally are determined. These combinations are stored to a component on which the processor is installed. Voltage identifiers are stored to a computer system in which the component is installed. The voltage identifiers are associated with combinations of the voltages and currents. A type of the computer systemis also stored to the component. A first clock frequency at which the processor operates is determined that is assigned to the type of the computer system. A first voltage and a first current are selected that are assigned to the first clock frequency. A first voltage identifier is found that is assigned to the combination of the first voltage and first current, and the first voltage identifier is sent to a voltage regulator, which supplies voltage to the processor.

Description

technical field [0001] The present invention relates generally to computer processors, and more particularly to the control of processors by a combination of operating clock frequency, voltage levels, and current levels. Background technique [0002] A computer system includes a combination of interconnected parts such as a shelf or enclosure, circuit boards, power supplies, memory, storage devices, cables, and processors. A processor is the part of a computer system that executes instructions and controls the operation of the computer system. Typically, processors are manufactured with a multi-step sequence of photographic and chemical processing steps during which electronic circuits are layered step by step on a wafer made of semiconductor material. This manufacturing process generally takes several weeks to perform. Each processor is then tested using automated test equipment in a process known as wafer testing to determine whether the processor is functioning properly...

AI Technical Summary

Problems solved by technology

For example, a processor may draw too much current at one clock frequency and voltage, causing it to get too hot and thus fail the test

However, if you lower the voltage, the current draw is also reduced, and if the processor is still fully functional (maybe at the same or a different clock frequency), it passes the test

[0004] Although this technique has the advantage of increasing processor yield, it has the disadvantage that each processor may have a different set of successfully tested voltage, current, and clock frequency combinations

So a side effect of increasing processor yields by changing combinations of voltage, current and clock frequency is a proliferation of part numbers and a proliferation of memory bins, which becomes unmanageable

[0005] Another disadvantage is that the operating environment of the computer system in which the processor is actually installed may be different from the environment of the test station in which the successfully tested combination was determined

For example, temperature, system workload, distributed voltage drop, voltage sense points, regulator differences, or the amount of voltage disturbance from nearby components may not be the same, which may cause the previously determined combination to no longer be correct

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