Device and method for measuring power amplifier performance parameter

A power amplifier and amplifier technology, applied in the field of signal processing, can solve the problem of inaccurate quantitative measurement, etc.

Inactive Publication Date: 2007-10-10
SHENZHEN GRENTECH CO LTD
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] This method can only qualitatively measure the memory length performance

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring power amplifier performance parameter
  • Device and method for measuring power amplifier performance parameter
  • Device and method for measuring power amplifier performance parameter

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] The present invention aims at the deficiencies of traditional test power amplifier performance parameters, especially the non-linearity and memory length of power amplifiers that cannot be accurately measured. The present invention uses a time-domain analysis method to provide a method for measuring the nonlinearity and memory length of power amplifiers. measuring device.

[0046] Please refer to FIG. 1 , which is a schematic diagram of a preferred embodiment of the device for measuring performance parameters of a power amplifier according to the present invention. The measurement device 100 of the present invention includes: a function operation module 110 , a cross-correlator module 120 , a non-linearity output module 130 , an autocorrelator module 140 , and a memory length output module 150 .

[0047] Specifically:

[0048] The function operation module 110 performs signal processing on the test signal of the input power amplifier 200 according to a predetermined fu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A device used for measuring performance parameters of power amplifier consists of function operation module for carrying out operation according to preset function, mutual correlator module for carrying out mutual correlation operation on output signal, nonlinear output module for carrying out normalization treatment on mode maximum value of output signal, self-correlator module for carrying out self-correlation calculation on output signal, memory length output module for carrying out judgment on output signal and for outputting memory length signal.

Description

technical field [0001] The invention relates to the technical field of signal processing, in particular to a device and method for measuring performance parameters of a power amplifier. Background technique [0002] A power amplifier (referred to as a power amplifier) ​​is a very widely used electronic component, especially when the power amplifier is used in the communication field, it is used to amplify various radio frequency signals to meet the requirements of transmission or reception. [0003] There are many indicators to measure the performance of the power amplifier, such as nonlinearity, memory effect length, output power, processing bandwidth and so on. For these indicators, there are some related testing methods and devices in the industry. However, for two important indicators of power amplifiers: nonlinearity and memory effect length (or memory length), the industry can only conduct qualitative or insufficient tests at present. precise measurements. [0004] S...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/00G01R31/28
Inventor 童进
Owner SHENZHEN GRENTECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap