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Method for testing electrical elements using an indirect photoelectric effect

A component and electrical technology, applied in the field of non-contact electrical testing, can solve the problems of easy oxidation of discharge electrodes and deterioration of discharge electrodes

Inactive Publication Date: 2008-01-30
BEAMIND
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the above-mentioned discharge electrodes are very fragile and easily oxidized, and various other phenomena easily degrade the above-mentioned discharge electrodes over time

Method used

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  • Method for testing electrical elements using an indirect photoelectric effect
  • Method for testing electrical elements using an indirect photoelectric effect
  • Method for testing electrical elements using an indirect photoelectric effect

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Experimental program
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Embodiment Construction

[0113] 2A is a cross-sectional view of a method of injecting electrons into a conductor to be tested according to the present invention. Figure 2B is a cross-sectional view of the method of ejecting electrons from the conductor. The second method itself is a conventional method, but it can be combined with the first method to constitute an aspect of the present invention.

[0114] Both methods here are applied to conductors 10 disposed on an insulating substrate 12 of a connection medium containing various other conductors (not shown). They are carried out under approximately vacuum (partial vacuum) with electron discharge and collecting plate 20 and a particle beam BI (here a beam of ultraviolet light) producing a photoelectric effect. The photoelectric shock zone or test point here is the contact point plate 11 on the conductor 10 covered by soldering paint 13 .

[0115] The discharge and collection plate 20 includes a support plate 21 made of silicon dioxide, which can al...

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PUM

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Abstract

The invention concerns a method for testing electrical elements (10, 11, 13) using at least one electron discharging electrode (22), at least one electron collecting electrode (22) and at least one beam of particles (BI), including ejecting electrons present in the discharge electrode (22) by means of the beam of particles and injecting into an element (10, 11, 13) electrons supplied by the discharge electrode, and ejecting electrons present in an element (10, 11, 13) by means of the beam of particles and collecting with the collecting electrode the electrons ejected from the element. The invention is characterized in that the ejection of the electrons present in the discharge electrode (22) includes applying to the discharge electrode a reflected beam of particles (BR) derived from the reflection on at least one element of an incident beam of particles (BI). The invention provides the advantages of simplifying the step of injecting electrons into an element and of simplifying the structure of the discharge and collection electrodes.

Description

technical field [0001] The present invention relates to the use of the photoelectric effect for non-contact electrical testing of electrical conductors arranged on an insulating substrate. In particular, the present invention relates to electrical testing of connection media such as printed circuits and chip carriers. Background technique [0002] Electrical testing of connection media is a major challenge in the electronics industry today and is an essential part of the manufacturing process for such connection media. Traditionally, two main test sequences, continuity testing and insulation testing, have to be performed to ensure that the interconnecting conductors are free from any manufacturing defects. Continuity testing involves checking that the conductor is not severed between its ends, more precisely between the connection points (usually contact pads) to which the conductor is joined. Therefore, the goal is to measure the resistance of the conductor between the af...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/308G01S15/89G10K11/34
CPCG01R31/311G01R31/302G01R31/308G01R29/24G01R31/28
Inventor 克里斯多弗·沃彻真倪-杰克·亚伯特
Owner BEAMIND