Sample supporter for scanning electronic microscope

Abstract

The utility model discloses a sample support for scanning electronic microscope, to prevent the sample support screw from turning out of the base and jamming on the platform. The sample support comprises a sample platform and a base with a plurality of threaded hole in the middle, and a screw mechanism; wherein, the screw used for adjusting height is arranged at the lower part of the screw mechanism. The screw is connected with the threaded hole; the lower part of the screw mechanism can screw into the base without exceeding the base thickness; the sample platform is connected with the top of the screw mechanism. The screw mechanism consists of two parts, the lower part is provided with the screw, and the top is provided with a replaceable module which is connected with the lower part of the screw mechanism and the sample platform respectively via a fast release device; the fast release device is of threaded screw structure; and the height of each replaceable module is determined according to the real need.

Description

technical field [0001] The invention relates to a sample holder for a scanning electron microscope. Background technique [0002] The sample holder of existing scanning electron microscope (S-4700 and S-4800), as shown in Figure 1, it comprises sample stage 1, screw rod 2 and base 3, is placed with sample 5 on sample stage 1, this sample holder It is easy to screw the screw 2 out of the base 3 when adjusting the height, as shown in Figure 2, it may not be easy to find when it is put into the scanning electron microscope room, but it will be stuck on the platform 4 when it is taken out from the scanning electron microscope room. And when the height adjustment range of the sample holder is relatively large, the existing holder needs to replace the screw rods of different lengths. Frequent replacement may easily cause tooth scratches between the screw holes of the base and the screw rods, which will bring hidden dangers to the safe operation of the scanning electron microscope....

AI Technical Summary

Problems solved by technology

[0002] The sample holder of existing scanning electron microscope (S-4700 and S-4800), as shown in Figure 1, it comprises sample stage 1, screw rod 2 and base 3, is placed with sample 5 on sample stage 1, this sample holder It is easy to unscrew the screw 2 out of the base 3 when adjusting the height, as shown in Figure 2, it may not be easy to find when it is placed in the scanning electron microscope room, but it will be stuck on the platform 4 when it is taken out of the scanning electron microscope room

And when the height adjustment range of the sample holder is relatively large, the existing holder needs to replace the screw rods of different lengths. Frequent replacement may easily cause tooth scratches between the screw holes of the base and the screw rods, which will bring hidden dangers to the safe operation of the scanning electron microscope. can drop parts on the sample holder into the scanning electron microscope chamber

In these cases, the scanning electron microscope room needs to break the vacuum to take out the sample holder, which will cause the crash of the scanning electron microscope machine and have a great impact on the performance and service life of the scanning electron microscope machine.

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