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X radial energy spectrometer with compatible measurement of thin sample and thick sample

An X-ray and energy spectrometer technology, applied in the field of X-ray energy spectrometer, can solve the problems of complex pre-processing, inconvenient test, application field limitation, etc., achieve high-precision measurement results, simple, convenient and fast measurement, and satisfy experimental research. the desired effect

Active Publication Date: 2010-06-02
BEIJING PURKINJE GENERAL INSTR
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Problems solved by technology

Its disadvantages are: the Compton scattering effect due to the thick sample, the sensitivity is reduced; the test time is long, it is necessary to wait for inflation and collection, and the gas consumption is large, so the test is inconvenient
[0004] Because the traditional energy spectrometer adopts thick sample technology, although it can conveniently and widely select samples, the measurement accuracy is limited
However, the energy spectrometer that simply uses the existing thin sample technology requires complex pretreatment of the sample, so it needs to be carried out under relatively strict experimental conditions. Although the measurement accuracy is guaranteed, the application field is also limited.

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  • X radial energy spectrometer with compatible measurement of thin sample and thick sample
  • X radial energy spectrometer with compatible measurement of thin sample and thick sample

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Embodiment 1

[0012] Embodiment 1: The X-ray energy spectrometer for compatible measurement of thin samples and thick samples described in this embodiment, its structure is shown in the attached figure 1 , where 1 is the X-ray exit window, 2 is the safety shutter mechanism, 3 is the X-ray tube, 4 is the interfering light blocking structure, 5 is the detector, 6 is the thin sample slot, and 7 is the thick sample. Wherein the X-ray exit window 1 is coaxial with the X-ray beam, the thin sample slot 6 is arranged between the X-ray exit window 1 and the X-ray tube 3, and the interfering light blocking structure 4 is arranged between the X-ray tube 3 and the detector 5 Between, the safety shutter mechanism 2 is arranged between the X-ray tube 3 and the detector 5 and the X-ray exit window 1 . The thin sample slot 6 used in this embodiment is a slot with a thickness of 2 to 3 mm, which has two functions: when measuring a thick sample, different types of attenuation sheets can be flexibly inserted ...

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Abstract

The invention is a thin and thick compatible measurement of X-ray energy spectrometer, including the X-ray emission window, security-gate structure, X-ray tube, interference block structure, detectorsand thin samples slots. The X-ray emission window and X-ray beam are coaxial, the thin samples slots was set between X-ray tube window and the X-ray tube, the interference block structure was set between the X-ray tube and detector, the security-gate structure was installed between the X-ray tube and detector and the X-ray emission window. The advantage of the said thin and thick compatible measurement of X-ray energy spectrometer lies in that it effectively combines the merit of the thin and thick technical detectors, which not only satisfies the simple convenience sample measurements in general mining company, but also obtains more accurate measurement results, and meets the needs of experimental research.

Description

technical field [0001] The invention relates to an X-ray energy spectrometer for compatible measurement of thin samples and thick samples. Background technique [0002] The main feature of the traditional energy spectrometer is the reflective collection of X-ray fluorescence, and the use of thick sample technology, that is, the sample is made into a plate with a thickness of more than 5mm by a hydraulic pressure sample device and then measured. Its disadvantages are: due to the Compton scattering effect caused by the thick sample, the sensitivity is reduced; the test time is long, it is necessary to wait for inflation and collection, and the gas consumption is large, so the test is inconvenient. However, since the thick sample technique does not require complex chemical pretreatment, it is widely used in various fields that do not require high measurement accuracy. [0003] The principle of the existing thin sample technology detector is to measure the thin sample obtained ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20
Inventor 田宇纮
Owner BEIJING PURKINJE GENERAL INSTR