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Capacitance-type material level indication

A container and elevation technology, applied in the field of calibration of material elevation indication systems, can solve problems such as low dielectric properties

Inactive Publication Date: 2008-03-19
VENTURE MEASUREMENT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For example, when trying to probe the elevation of materials, several difficulties may be encountered, such as having very low dielectric properties

Method used

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  • Capacitance-type material level indication

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Experimental program
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Embodiment Construction

[0007] The Figure is a system 10 for detecting and indicating the elevation of material 12 within a container 14, according to an exemplary embodiment of the present disclosure. System 10 includes a probe 16 connected to vessel 14 such that it is sensitive to changes in vessel capacitance as a function of the elevation of material 12 within the vessel. A driver amplifier 18 is connected to the probe 16 for applying a periodic electrical signal to the probe. The exciter 18 receives an input from a variable frequency generator 20 for controlling the frequency of the signal applied to the probe. A digital signal processing (DSP) engine 22 controls the operation of the variable frequency generator and receives an input from the generator representing the frequency of the signal applied to the probe. Probe 16 is also connected to amplifier 24 . Amplifier 24 preferably converts current feedback from probe 16 into a voltage signal and applies the voltage signal to digital signal pr...

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Abstract

A method of indicating level of material in a vessel includes coupling a probe to the vessel such that capacitance at the probe varies as a function of material level in the vessel. A periodic electrical signal at fixed frequency is applied to the probe such that operating characteristics of the signal vary as a function of capacitance at the probe. Material level is detected as a function of the operating characteristics of the signal. During a calibration mode of operation, the fixed frequency of the periodic electrical signal is varied to optimize sensitivity at the probe. In a preferred embodiment of the disclosure, this is carried out by applying the periodic electrical signal to the probe over a selected frequency range during the calibration mode of operation and identifying a frequency within this range at which the probe is most sensitive to changes in capacitance at the probe. The fixed frequency during a measurement mode of operation thereafter is set to this identified frequency.

Description

technical field [0001] The present disclosure relates to indicating an object, such as the elevation of material within a storage container, as a function of the capacitance of the material within the container. In particular, the invention relates to the calibration of material elevation indicating systems to optimize the sensitivity of the system to changes in material elevation. Background technique [0002] US Patent 5,048,335 discloses a system for indicating the elevation of material in a container as a function of the capacitance of the material. A probe is adapted to be connected to the vessel such that it is sensitive to changes in capacitance within the vessel as a function of the elevation of the material. A circuit is connected to the probe such that the operating characteristics of the circuit vary as a function of the capacitance at the probe. During a calibration mode of operation in which predetermined operating characteristics are detected, a calibration c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01F23/26
CPCG01F23/266G01F23/261G01F25/0061G01F25/20
Inventor O·A·艾拉佐
Owner VENTURE MEASUREMENT