Integrated circuit tester
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- 苏州均华精密机械有限公司
- Publication Date
- 2011-07-13
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
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Abstract
Description
technical field
[0001] The invention relates to a detection device, especially a detection device for integrated circuits, especially a detection device for the printing quality of integrated circuits after laser marking and surface defects of integrated circuits, and belongs to the technical field of integrated circuit manufacturing. Background technique
[0002] In the process of integrated circuit manufacturing, laser marking is usually used, and an inspection system is required to confirm the quality of laser marking and detect surface defects of the original integrated circuit. Visual inspection is a commonly used method in the market at present, and the detection head is fixed, so the scope of one-time inspection is limited. That is to say, if all integrated circuit products are to be inspected, they must be divided into multiple sections, which affects the output speed of laser typewriters; and the scanning resolution is not high, and fine-tuning cannot be realized ac...