Memory device detecting method
A detection method and memory technology, applied in static memory, instruments, etc., can solve problems such as virtual welding, adhesion, and complex address line detection process, and achieve the effect of improving detection efficiency and accurate detection results.
Inactive Publication Date: 2008-06-11
SHENZHEN COSHIP ELECTRONICS CO LTD
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The invention discloses a test method for a storage, which mainly includes three test stages which are respectively read-write test, data wire test and address wire test and search for errors existed in the storage through step-by-step exclusive method which makes test results more accurately. Besides, the invention only needs utilizing the initial address and the final address to comprehensively detect whether the data wire has problems; and for detecting the address wire, the comprehensive test can be performed only by utilizing very few address locations. Moreover, through special arrangement of test data, test data groups and test address blocks, specific data wire and address wire on which an error is existed can be pointed out and the error can be reported in time, thereby greatly improving detection efficiency.
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