Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Touch screen device and debugging method thereof

A debugging method and touch screen technology, applied in the input/output process of data processing, instruments, electrical digital data processing and other directions, can solve problems such as inconvenience, low light energy, touch screen coordinate detection interference, etc., to achieve convenient debugging and cost saving Effect

Inactive Publication Date: 2008-07-23
GUANGDONG VTRON TECH CO LTD
View PDF0 Cites 36 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, in the infrared touch screen device, each pair of infrared emitting elements and infrared receiving elements are paired. Due to many reasons such as production technology, the optical axis of the infrared emitting element and the optical axis of the infrared receiving element may have a certain deviation angle. So that the infrared receiving element can only receive little or even no infrared light emitted by the emitting element, it is necessary to manually correct the angle between the optical axis of the infrared emitting element and the infrared receiving element, and on a touch screen, the used The number of infrared emitting elements and infrared receiving elements is large, and manual debugging will be more difficult and inconvenient. As the size of the touch screen increases, debugging will be more complicated. In addition, with the long-term use of the touch screen, the infrared emission Components and infrared receiving components will age, causing the light energy detected by the receiving tube to be very small, which will interfere with the coordinate detection of the touch screen, and even make the touch screen unable to work normally

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Touch screen device and debugging method thereof
  • Touch screen device and debugging method thereof
  • Touch screen device and debugging method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0026] As shown in FIG. 2, it is a schematic flowchart of Embodiment 1 of the debugging method of the touch screen device of the present invention. In this embodiment, when debugging, only the gain multiple of the receiving circuit corresponding to the receiving element is modified.

[0027] As shown in the figure, it includes the steps:

[0028] Step S201: Start an infrared scan to detect the intensity value of the infrared signal received by the infrared receiving element, which is called the detection value, and go to step S202;

[0029] Step S202: Determine whether the detection value is greater than or equal to the minimum predetermined value and less than or equal to the maximum predetermined value, that is, whether the minimum predetermined value <= the detection value <= the maximum predetermined value is satisfied, if not, go to step S203, if yes, Then there is no need to debug or complete the debugging of the relevant device parameters corresponding to the current infrar...

Embodiment 2

[0045] As shown in FIG. 3, it is a schematic flowchart of the second embodiment of the debugging method of the touch screen device of the present invention. In this embodiment, when debugging, only the pulse width of the transmitting circuit corresponding to the transmitting element is adjusted.

[0046] As shown in the figure, it includes the steps:

[0047] Step S301: Start an infrared scan to detect the intensity value of the infrared signal received by the infrared receiving element, which is called the detection value, and go to step S302;

[0048] Step S302: Determine whether the detection value is greater than or equal to the minimum predetermined value and less than or equal to the maximum predetermined value, that is, whether the minimum predetermined value <= the detection value <= the maximum predetermined value is satisfied, if not, go to step S303, if yes, Then there is no need to debug or complete the debugging of the relevant device parameters corresponding to the c...

Embodiment 3

[0066] There are many reasons why the signal strength received by the infrared receiving element is outside the optimal range. For example, the aging of the transmitting element causes the intensity of the infrared signal emitted under the same pulse width to become lower, and the aging of the receiving element causes the receiving sensitivity to decrease, As well as some other external factors such as dust occlusion, etc., therefore, in this embodiment, the pulse width of the transmitting circuit corresponding to the infrared emitting element and the gain multiple of the receiving circuit corresponding to the infrared receiving element are adjusted simultaneously. Elaboration.

[0067] As shown in the figure, in this embodiment, it includes the steps:

[0068] Step S401: Start an infrared scan to detect the intensity value of the infrared signal received by the infrared receiving element, which is called the detection value, and go to step S402;

[0069] Step S402: Determine whet...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a debugging method of touch screen and a relative touch screen. The method comprise starting infrared scanning to detect the detected value of infrared signal strength received by an infrared receiver, when the detected value is outside the best range, adjusting the device parameters of an infrared scanning module, when the detected value is in the best range, eliminating the adjustment. The invention starts infrared scanning and judges the infrared signal strength received by the infrared receiver, which eliminates the adjustment on the infrared emitter-receiver when the received infrared signal strength is in a preset range, and directly judges the debugging end on the infrared emitter-receiver, and adjusts the device parameters of the infrared scanning module when the received infrared signal strength is in the preset range. The invention can debug with hand operation, with simple maintenance and debugging to save debugging cost.

Description

Technical field [0001] The present invention relates to the technical field of touch screens, in particular to a debugging method of a touch screen device and a touch screen device. Background technique [0002] As a new type of computer input device, touch screen makes human-computer interaction more intuitive and brings great convenience to users. In addition to being widely used in personal portable information products, the application fields have covered information appliances, public information, and electronics. In various fields such as games and office automation equipment, the current passive touch screen technology mainly includes infrared, resistance, capacitance, surface acoustic wave and so on. Among them, take the infrared touch screen as an example. The realization principle is: a number of infrared emission is distributed around the touch screen Components and infrared receiving components. Among them, the infrared emitting components and the infrared receiving c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F3/042
Inventor 周春景徐响林
Owner GUANGDONG VTRON TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com