Chip with integrated read-only memory and built-in self-test system and its method

Abstract

The invention discloses a read-only-memory built-in self-test system and a method. The system of the invention comprises a chip and a normal data module, wherein, a read-only-memory and a comparator are integrated into the chip; predetermined storage data is stored into the read-only-memory; predetermined normal data which is stored into the read-only-memory is stored into the normal data module; under the condition of built-in self-test of the read-only-memory, the normal data in the normal data module is written into the chip; judgment is made whether comparison normal data of the comparator is consistent with the corresponding storage data in the read-only-memory; under the condition of consistence, correct information is outputted through a pin of the chip; under the condition of inconsistence, false information is outputted through the pin of the chip and the process of built-in self-test is stopped. Therefore, the process of built-in self-test can be completed without the necessity for reading out the data in the read-only-memory, and data safety is effectively protected.

Description

【Technical field】 [0001] The present invention relates to the field of integrated circuit design, in particular to a read-only memory (Read Only Memory, ROM for short) built-in self-test design (Build-In Self Test, BIST for short) technology integrated in a chip. 【Background technique】 [0002] At present, many chips are integrated with a read-only memory (ROM), and preset storage data, such as program codes, are usually stored in the ROM. For chips with integrated ROM, after mass production, it is necessary to test whether the stored data in the ROM of each chip is consistent with the preset standard data, so it is necessary to introduce ROM BIST (read-only memory built-in Self-test) This is a test item to screen out chips with data errors in the ROM. [0003] The existing ROM BIST test is usually like this: the carrier board (LoadBoard) with the chip to be tested is connected to the testing machine; the testing machine selects it as the test mode of ROMBIST by a pin of th...

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Problems solved by technology

[0004] Although the above method can perform ROM BIST test on the ROM of the chip, because this method can read the ROM data in the chip, it is easy to cause data leakage in the ROM, and there is a hidden danger of information security.

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