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LCM half-finished product electrostatic resistance limit voltage resistant test method

A technology for withstand voltage testing and semi-finished products, which is used in testing dielectric strength, nonlinear optics, instruments, etc., and can solve problems such as lack of

Active Publication Date: 2010-04-21
CPT TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is a lack of test methods and test data for the ultimate antistatic ability after being combined into semi-finished products (ie: IC+PWB+panel) in the LCM production process

Method used

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  • LCM half-finished product electrostatic resistance limit voltage resistant test method
  • LCM half-finished product electrostatic resistance limit voltage resistant test method
  • LCM half-finished product electrostatic resistance limit voltage resistant test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] Antistatic ability test method of ASIC components of PWB in LCM semi-finished products:

[0025] Step 11: Preparation of samples to be tested

[0026] Select 3-5 samples of LCM semi-finished products to be scrapped, and confirm that the PWB has no electrostatic defects on the lamp lighting machine in advance.

[0027] Step 12: Electrostatic Simulation Discharge Generator Setup

[0028] Adopt electrostatic analog discharge generator and set electrostatic discharge mode. For metal conductor parts such as ASIC (application-specific integrated circuit) pins or test holes, conical electrostatic needles need to be selected for contact discharge; refer to ASIC's withstand voltage specification of 4 -5KV, take 3KV as the reference starting point discharge voltage; the static voltage first selects the positive polarity voltage to discharge.

[0029] Step 13: Preparation for grounding of the sample to be tested

[0030] Place the LCM semi-finished product on an insulating plan...

Embodiment 2

[0040] Antistatic ability test method of IC in LCM semi-finished products:

[0041] Step 21: Sample preparation to be tested

[0042] Select 3 samples of LCM semi-finished products to be scrapped, and confirm that the IC has no electrostatic defects on the lamp lighting machine in advance.

[0043] Step 22: Electrostatic Simulation Discharge Generator Setup

[0044] Adopt electrostatic analog discharge generator and set the electrostatic discharge mode. For the electrostatic discharge of IC and other non-metallic conductor parts, it is necessary to select a semi-spherical electrostatic needle for air discharge; the reference IC withstand voltage specification is 2-3KV, and 1KV is taken as The discharge voltage of the reference starting point; the electrostatic voltage is firstly selected for positive polarity voltage discharge.

[0045] Step 23: Preparation for grounding of the sample to be tested

[0046] Place the LCM semi-finished product on an insulating plane; ground t...

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Abstract

The invention relates to a method for testing ultimate antistatic capacity of LCM (liquid crystal module) semi-finished products, comprising the following steps of preparing a sample to be tested, setting a static simulative discharge generator, preparing for earthing of the sample to be tested, starting a static gun discharge switch to test instrument connections one by one, and lighting confirmation, namely, after an earth wire is taken, the sample is tested on a lamp stage for lighting confirmation that whether damage by static electricity exists. If poor static does not happen, discharge voltage is increased to verify, the step of starting a static gun discharge switch to test instrument connections one by one is repeated until ESD (damage by static electricity) happens; if the poor static happens, the discharge voltage is decreased to verify. The method can test the antistatic capacity of new products or the LCM semi-finished products which are put into production, and also can contrast the level of antistatic capacities of different materials of different manufacturers.

Description

【Technical field】 [0001] The invention relates to a test method for the ultimate antistatic ability of static-sensitive products, in particular to a test method for the ultimate antistatic ability of LCM (liquid crystal display module) semi-finished products. 【Background technique】 [0002] In the production process of LCM modules, when new products are imported for mass trial, it is necessary to conduct anti-static limit withstand voltage tests on IC (semiconductor components), PWB (printed circuit boards), panels and other materials combined into semi-finished products to verify that new products Whether it meets the requirements when it is put into mass production in the future. In addition, if it is necessary to compare whether there are differences in the antistatic capabilities of raw materials from different manufacturers, it is also necessary to conduct antistatic limit withstand voltage tests on IC, PWB, panels and other materials combined into semi-finished product...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13G01R31/12
Inventor 张仁永
Owner CPT TECH GRP