Test equipment, test system and test data storage method

Abstract

The invention discloses a testing device, a testing system and a testing data storage method. The testing device comprises a memory and an effective signal filter for receiving enabling VLD signal and clock CLK signal output by a module to be tested; when the VLD signal indicates the output data are effective, the CLK signal is transmitted to the memory and when the VLD signal indicates that the output data are ineffective, the permanent electric level is transmitted to the memory. The memory is used for receiving the testing data output by the module to be tested and storing the received CLK signal and the testing data when receiving the CLK signal transmitted by the effective signal filter. The technical proposal provided by the invention can increase the utilization rate of the memory of the testing device and ensure the memory to play a greater role in the testing.

Description

technical field [0001] The invention relates to the field of electronics, in particular to a testing device, a testing system and a testing data storage method. Background technique [0002] During the long-term stability test of the data bus, in order to monitor the test data, there are usually two ways, one is to convert the data bus interface in the system into a common interface, such as USB, network port, etc. The data is downloaded to the hard disk for analysis; the second is to capture each bit of data on the data bus and put it into the memory for analysis with the help of test instruments, such as oscilloscopes and logic analyzers. The memory includes random access memory (RAM), read-only memory (ROM), and high-speed cache (CACHE), which is characterized by fast storage speed but high manufacturing cost. [0003] Among them, the advantage of using professional testing instruments is that it can capture detailed data bus information including timing information, and...

AI Technical Summary

Problems solved by technology

However, professional testing instruments have a small memory and can only store data for a few seconds or even tens of milliseconds

When testing for a long time, the storage space of the test module is easily insufficient; and if the capacity of the memory in the test instrument is increased, the cost will be increased and the cost will be increased.

[0004] In addition, the system often encounters occasional data errors caused by a certain part being affected by the outside world or clock offset. This kind of error has a low probability of occurrence, strong randomness, and is difficult to capture. If a test instrument is used, due to the low probability of error occurrence and long cycle, Therefore, manpower cannot implement tracking, and random errors are difficult to accurately capture; if you download error data to a PC, although a large amount of data can be stored, it is difficult to analyze irregular error information because it cannot capture the timing information on the data line

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