Automatic test method and system

Abstract

The invention provides an automatic test method and a system. The method comprises the following steps: A. a link layer discovery protocol (LLDP) enabling is conducted to a tested device so that the tested device obtains and stores a link connection information according to the LLDP; B. the automatic test system accesses the tested device and obtains the stored link connection information in the tested device; C. a network topology is generated and stored according to the obtained link connection information in the tested device; D. an automatic test is carried out on the tested device according to the generated topology. According to the invention, the automatic discovery of the tested environment topology proceeds, thereby the test efficiency is improved and the test cost is saved.

Description

technical field [0001] The invention belongs to the technical field of automated testing, and in particular relates to an automated testing method and system for automatic topology discovery based on LLDP (Link Layer Discovery Protocol, Link Layer Discovery Protocol). Background technique [0002] With the vigorous development of automated testing technology, automated testing systems have gradually penetrated into all aspects of software testing. When automated testing begins to build a test environment, the manual configuration of the test environment is complex and requires multiple connections between the devices under test and between the devices under test and the test device, which can easily lead to inconsistencies between the actual connection physical topology and the expected physical topology, affecting automation test. Even when the cable is loosely inserted during the connection, the actual connection physical topology is inconsistent with the expected physica...

AI Technical Summary

Problems solved by technology

When automated testing begins to build a test environment, the manual configuration of the test environment is complex and requires multiple connections between the devices under test and between the devices under test and the test device, which can easily lead to inconsistencies between the actual connection physical topology and the expected physical topology, affecting automation test

Even when the cable is loosely inserted during the connection, the actual connection physical topology is inconsistent with the expected physical topology. This is more difficult to find than the previous connection error, which directly affects the effect of the automated test, and even leads to the failure of the automated test.

[0003] In the process of automated testing, if the test environment is artificially or otherwise abnormally changed, the test topology will also change accordingly, which will make future tests invalid.

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