Semiconductor device testing and sorting machine

Abstract

The invention discloses a separator for testing semiconductor devices, belonging to the field of semiconductor device detection technique. The separator comprises a rotation workbench which is arranged at the upper end of a vertical shaft; the external circumference of the rotation workbench is uniformly provided with a plurality of liftable suction nozzles; the rotation workbench is sequentially provided with a separation platform, a first rotation positioning device, a detection head, an image camera, an auxiliary rotation disc, a second rotation positioning device, a blanking mechanism and a braiding mechanism which are arranged in clockwise direction or anticlockwise direction and corresponding to the positions of the suction nozzles; the separation platform is connected with the blanking mechanism; the first rotation positioning device and the second rotation positioning device respectively comprise a cavity which is adaptable for the device to be detected; the cavity is arranged below the suction nozzle at the corresponding working position; the circumference of the auxiliary rotation disc is uniformly provided with a plurality of concave cavities which can hold the device to be detected; and the side surface of the auxiliary rotation disc is provided with a marking laser head which is corresponding to the concave cavity. The separator leads a computer to control a plurality of detection devices to work cooperatively, can realize detection, marking, separating and braiding, and has compact structure and high efficiency.

Description

technical field [0001] The invention relates to a device for testing and sorting semiconductor devices. Background technique [0002] After the semiconductor device is manufactured, it needs to be inspected, marked, sorted, and taped and packaged. In the prior art, the above-mentioned work processes are carried out independently. low. Contents of the invention [0003] The object of the present invention is to provide a semiconductor device testing and sorting machine, so that the detection, marking, sorting and tape braiding of semiconductor devices can be realized on one machine. The device has a compact structure and high detection efficiency. [0004] The purpose of the present invention is achieved in the following way: a semiconductor device testing and sorting machine includes a horizontally arranged rotary table, the rotary table is installed on the upper end of the vertical shaft, and a number of liftable suction nozzles are evenly distributed on the outer circum...

AI Technical Summary

Problems solved by technology

[0002] After the semiconductor device is manufactured, it needs to be inspected, marked, sorted, and taped and packaged. In the prior art, the above-mentioned work processes are carried out independently. low

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