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Probe card

A probe card and probe technology, applied in the field of probe cards, can solve the problems of low service life and insufficient mechanical strength, and achieve the effect of reducing interference

Inactive Publication Date: 2009-10-07
MPI CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This approach has two disadvantages. First, the physical characteristics of metal wires are different from the traditional physical characteristics of probes. Therefore, using the front end of metal wires to replace probes may have insufficient mechanical strength and low service life. question

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0076] see figure 1 , figure 2 , image 3 ,and Figure 4 As shown, it is a probe card disclosed by an embodiment of the present invention, which includes a circuit board 10, a spacer 20, a probe head 30, a base 60, and a plurality of flexible jumpers. A wire plate 40 and a plurality of metal wires 50 .

[0077] In this embodiment, the circuit board 10 is circular, but the shape of the circuit board 10 is not limited to the circular shape, and may be other shapes. A test circuit is provided on the circuit board 10 to provide a signal conduction path required for testing the chip, and a plurality of pads 12 are formed on the circuit board 10 for connecting signal lines to communicate with the test circuit on the circuit board 10 . In addition, the center of the circuit board 10 has a wiring hole 11 , the wiring hole 11 is generally circular and located at the center of the circuit board 10 .

[0078] The spacer 20 is annular, and its outer diameter is similar to the inner ...

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PUM

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Abstract

The invention discloses a probe card comprising a circuit board, a base, a probe, at least one flexible jumping wire board and a plurality of metal conducing wires. The circuit board is provided with a wiring hole and the metal conducing wires pass through the wiring hole. The base is provided with a plurality of through holes arranged at the bottom of the circuit board, and the probe is provided with a plurality of wire probes and arranged on the bottom of the base so that each wire probe corresponds to each through hole and the probe is arranged below the wiring hole. The flexible jumping wire board is arranged above the circuit board and electrically connected to the circuit board so as to provide an electric conduction path connected to the circuit board. The metal conducting wires are electrically connected with the wire probes and the flexible jumping wire board after passing through the wiring hole so that the wire probes are electrically connected to the circuit board after passing through the metal conducting wires and the flexible jumping wire board.

Description

technical field [0001] The present invention relates to probe cards, in particular to probe cards that use non-rigid connection elements to connect circuit boards and probes. Background technique [0002] The probe card uses fine probes to touch the signal contacts of the chip under test, feeds the chip under test into the chip under test, and receives the feedback signal of the chip under test to determine whether the chip under test can operate normally. [0003] The main structure of the probe card includes a circuit board, connecting elements, and a probe head. The probe head has probes, and the probes are arranged on a base. The base is fixed on the bottom surface of the circuit board by mechanical connection, and then electrically connects the probe and the circuit board through the connecting element, so that the probe can receive the test signal of the circuit board, and the circuit board can receive the feedback signal through the probe . The probe head is arrange...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/073G01R1/06
Inventor 钟士能简志忠苏文彬
Owner MPI CORP