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Multifunctional automatic test system

An automatic test system and multi-functional technology, which can be used in measurement devices, photometry, optical radiation measurement, etc. The effect of improving test efficiency

Inactive Publication Date: 2009-11-04
SHENXUN COMP KUNSHAN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] As we all know, all electronic device manufacturers have to carry out a lot of tests in the production process, such as keyboard function test, audio function test, display function test, etc. They are all tested manually, that is, manually press each key on the keyboard one by one to complete the test with the corresponding test program. This method is time-consuming and labor-intensive, and its test efficiency is low. The test method of pressing the key, due to the different pressing force, or the pressing on the surface of the key cap, it is very easy to cause misjudgment, which will make the test quality of the keyboard even more uncertain.

Method used

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Embodiment Construction

[0018] figure 1 It is a block diagram of a preferred embodiment of the present invention, the multifunctional automatic test system 10 includes: a receiving module 101 , a processing module 102 interconnected, a storage module 103 and a display module 104 .

[0019] Wherein, the receiving module 101 is connected with a device under test 20, and is used to receive the signal output by the device under test 20, and transmit the signal to the processing module 102, and the receiving module 101 can be a sound sensor, and the processing module 102 uses Process the signal transmitted by the receiving module 101, and compare the processed signal with the test program information input by the system in real time, and feed back the operation result to a display module 104; and the processing module 102 can be An 8051 single-chip computer, the 8051 single-chip computer has written the corresponding test program in advance, and the test program information is stored in the storage module...

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Abstract

The invention relates to a multifunctional automatic test system which can be widely applied to electronic equipment test needing external input when in test and comprises a receiving module, wherein the receiving module is connected with tested equipment and is used for receiving signals output by the tested equipment and transmitting the signals to a processing module; the processing module is used for processing the signals transmitted by the receiving module, comparing the processed signals with test program information primarily input by the system in real-time, and feeding back the operating result to a display module; and the display module displays the test result. In addition, the multifunctional automatic test system also comprises a storage module used for storing the test program information primarily input to the system. The multifunctional automatic test system automatically tests, thereby greatly improving the test efficiency, avoiding the misjudgment caused by artificial causes, and improving the test quality.

Description

【Technical field】 [0001] The invention relates to a testing system, in particular to a multifunctional automatic testing system which needs external input during testing. 【Background technique】 [0002] With the continuous development of electronic technology, more and more electronic products are widely used in people's daily life, such as notebook computers, handheld mobile communication devices, etc. These electronic products are changing people's lives at an alarming speed. way of life and work. [0003] As we all know, all electronic device manufacturers have to carry out a lot of tests in the production process, such as keyboard function test, audio function test, display function test, etc. They are all tested manually, that is, manually press each key on the keyboard one by one to complete the test with the corresponding test program. This method is time-consuming and labor-intensive, and its test efficiency is low. The test method of pressing the key, because the ...

Claims

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Application Information

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IPC IPC(8): G06F11/22G01H17/00G01J1/00
Inventor 陆益军
Owner SHENXUN COMP KUNSHAN