Anti-secondary hit device of drop hammer impact tester

Abstract

The invention relates to a device of a drop hammer impact tester, belonging to the field of experimental equipment. An anti-secondary hit device of the drop hammer impact tester comprises a support saddle, a drop hammer guide rail (2) and a drop hammer (3) on the support saddle and is characterized in that the support saddle is provided with a drop hammer falling-preventing mechanism (4), the vertical height of the drop hammer falling-preventing mechanism (4) is higher than the height of a sample (1) placed on the horizontal plane of the support saddle, the drop hammer falling-preventing mechanism (4) comprises a control unit (41) and a transverse motion unit (42), the transverse motion unit (42) is driven by the control unit (41) to move in reciprocating way along the horizontal plane of the drop hammer (3), one end of the transverse motion unit (42) is moved inside a mapping range of the drop hammer (3) on the horizontal plane, and the other end is moved outside the mapping range of the drop hammer (3) on the horizontal plane. When the drop hammer impact sample on the tester back-bounces, the anti-secondary hit device quickly extends below the drop hammer to prevent secondary hit of the drop hammer on the sample and ensures accuracy of a testing result.

Description

Technical field [0001] The invention relates to a device for a drop-weight impact testing machine, in particular to a device for preventing a sample from being hit twice in a drop-weight impact test. Background technique [0002] When the traditional drop weight impact testing machine is used for testing, usually the drop weight is released from a certain test setting height and freely falls along the guide rod to impact the standard sample, and then test the sample to obtain the required data. Because the material of the sample is different and the test method is different, there are also many types of drop-weight impact testing machines. When these drop-weight impact testing machines are in the drop-weight impact test, after the drop-weight hits the sample, because the collision between the drop-weight and the sample is different from the material of the sample, sometimes the drop-weight will rebound to a certain height and form a secondary Hit the sample even three times. [0...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide an anti-secondary strike device for a drop hammer impact testing machine, which solves the problem of secondary or multiple blows to the sample formed by the fall of the drop hammer in the prior art, which affects the accuracy of the test data. Defects

Images