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Method for processing measured ohm resistance R(t) of measuring element with temperature-dependent ohm resistance

A technology of measuring components and ohmic impedance, applied in the direction of measuring electrical variables, measuring devices, temperature compensation and modification, etc., can solve problems such as the inability to calculate absolute temperature, and achieve the effect of improving accuracy and accurate determination

Active Publication Date: 2014-03-05
VOLKSWAGEN AG
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

So the exact absolute temperature cannot be calculated from the internal resistance without compensating for this

Method used

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  • Method for processing measured ohm resistance R(t) of measuring element with temperature-dependent ohm resistance
  • Method for processing measured ohm resistance R(t) of measuring element with temperature-dependent ohm resistance
  • Method for processing measured ohm resistance R(t) of measuring element with temperature-dependent ohm resistance

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Embodiment Construction

[0037] The method according to the invention will be explained below with the aid of a jump lambda detector of an exhaust system of an internal combustion engine according to the Nernst principle. But this is only exemplary. All statements below apply analogously to each measuring element having a temperature-dependent ohmic resistance.

[0038] The jump lambda detector, hereinafter referred to as "the detector", is partly surrounded by exhaust gas from the exhaust system of the internal combustion engine. When measuring the detector at time t x The impedance value R(t x ), at the same time determine the measured impedance value R(t x ) time t x Lambda value λ(t x ). Lambda values ​​λ(t x ) of the determination. From Lambda value λ(t x ) to determine the correction factor K λ (t x ), and use this correction factor to calculate the corrected impedance value R according to the following equation korr (t x )

[0039] R korr (t x ) = R(t x )·K λ (t x ) (1). ...

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Abstract

The method involves measuring ohm resistance of a measuring element at a time point. A correction factor is determined from physical and / or chemical parameter of gases surrounding the measuring element at the time point of the measurement of the ohm resistance. The correction factor is predetermined for different values for the physical and / or chemical parameter of the gases. The correction factor is determined according to a preset formula. Adjustment of the measured ohm resistance is determined depending on the physical and / or chemical parameter of the measuring element.

Description

technical field [0001] The invention relates to a method according to the preamble of claim 1 for processing the measured ohmic impedance of a measuring element having a temperature-dependent ohmic impedance, in particular a Nernst probe R(t), where at time t x Measure the ohmic resistance R(t of the measuring element x ), and in measuring the measured ohmic impedance R(t x ) measurement time t x , determined from at least one physical and / or chemical parameter of the gas surrounding the measuring cell according to the correction factor K λ The correction factor K λ (t x ), these correction factors K λ is predetermined for different values ​​of at least one physical and / or chemical parameter of the gas surrounding the measuring element, wherein the corrected resistance value R is determined according to the following equation korr (t x ) [0002] R korr (t x ) = R(t x )·K λ (t x ). [0003] The method involves the measurement of the impedance of a measuring elem...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/44G01R27/00G01N27/04
CPCF02D41/1493G01N27/4065
Inventor H·哈恩
Owner VOLKSWAGEN AG
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