Paddle-exposed and chip-upright packaging structure for heat dissipation block with locking holes
A technology of packaging structure and heat dissipation block, which is applied in the direction of electrical components, electric solid devices, circuits, etc., can solve the problems of small and limited metal base island volume and area, and achieve the ability to avoid rapid aging or even burn or burn out, and heat dissipation strong effect
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0022] see Figure 5 , Figure 5 It is a schematic diagram of Embodiment 1 of the packaging structure of the thermal block with the exposed chip on the base island and the mounting locking hole of the present invention. Depend on Figure 5 It can be seen that the base island of the present invention exposes the package structure of the heat sink block with the chip being installed in the locking hole, including the chip 3, the metal base island 1 carried under the chip, the metal inner pin 4, and the metal for signal interconnection from the chip to the metal inner pin. Wire 5, conductive or non-conductive heat-conducting adhesive substance I2 between the chip and the metal-based island, and a plastic package 8, the metal-based island 1 exposes the plastic package 8, and a heat dissipation block 7 is arranged above the chip 3, the The heat dissipation block 7 has a locking hole 7.1, and a conductive or non-conductive thermally conductive bonding substance II6 is embedded bet...
Embodiment 2
[0025] The only difference between Embodiment 2 and Embodiment 1 is that the heat dissipation block 7 has an inverted "T" structure, such as Figure 6 .
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com
