Compensation type pulse X-ray detecting device with double scintillators

A double scintillator and detection device technology, which is applied in measuring devices, X/γ/cosmic radiation measurement, radiation measurement, etc., can solve the problems of unstable detection sensitivity and inability to meet the requirements of absolute measurement of ray intensity, and achieve improved The effect of a flat range
CN102109606BActive Publication Date: 2012-10-24NORTHWEST INST OF NUCLEAR TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
NORTHWEST INST OF NUCLEAR TECH
Publication Date
2012-10-24

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Abstract

The invention relates to a compensation type pulse X-ray detecting device with double scintillators, which comprises a hollow metal shell, an entrance window and an exit window that are arranged on two opposite ends of the metal shell, a detecting component and a photoelectric detector; the detecting component is arranged in the cavity surrounded by the metal shell, the entrance window and the exit window; the photoelectric detector is communicated with the cavity through a hole arranged in the metal shell; the detecting component comprises an inorganic thin film scintillator and an organic thin film scintillator; the inorganic thin film scintillator is arranged inside the entrance window, and the organic thin film scintillator is arranged inside the exit window. The device solves the technical problem that the existing detecting device is unstable in detecting sensitivity and cannot satisfy the absolute measurement demands of ray intensity. The device has the advantages of flat sensitivity response and relatively quicker response time, and can be used for the absolute measurement of the radiation field intensity of pulse X-ray in energy section.
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Description

technical field

[0001] The invention belongs to radiation detection devices, in particular to a scintillation detection device suitable for absolute measurement of pulse X-ray intensity. Background technique

[0002] The intensity and number of X-rays are one of the main parameters of the pulsed X-ray source and radiation field, which directly determine the result of the interaction between X-rays and matter. Therefore, measuring the absolute intensity and number of X-rays and their changes with time has become the core content of pulsed X-ray research. Obtaining the absolute intensity and number of pulsed X-ray radiation fields requires accurate knowledge of the energy spectrum of the pulsed X-ray source and the response (sensitivity) of the detection device to X-rays of different energies. However, so far, there are still great difficulties in accurately measuring the energy spectrum of pulsed X-ray sources and radiation fields. In this case, to obtain parameters such as ...

Claims

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