Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Emulation validation method of reading operation function of memory

A technology of simulation verification and operation function, applied in the direction of software simulation/interpretation/simulation, software testing/debugging, program control devices, etc., can solve the problems affecting the verification efficiency of memory read operation function, etc., so as to improve the simulation verification efficiency and ensure the accuracy sexual effect

Active Publication Date: 2014-05-07
GIGADEVICE SEMICON SHANGHAI INC +1
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In addition to the above examples, no matter which order of verifying the read operation mode is used, it will involve changing the read operation mode control bit from 0 to 1, that is, each full verification process must go through at least one erasure of the read operation mode control bit operation, thereby affecting the efficiency of functional verification of memory read operations

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Emulation validation method of reading operation function of memory
  • Emulation validation method of reading operation function of memory
  • Emulation validation method of reading operation function of memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0046]The following briefly introduces the three read operation modes of the memory.

[0047] The first type: Read data

[0048] In Normal mode, the corresponding read operation mode control bits are set to:

[0049] DSPI_LOCK=1, DREAD_LOCK=1;

[0050] Or, DSPI_LOCK=0, DREAD_LOCK=0.

[0051] In this read operation mode, DI_PAD is an input port, send an 8-bit command (03h), and after the 24-bit first address, the data will be output from DO_PAD (output port).

[0052] The second type: Fast read

[0053] In Normal mode, the corresponding read operation mode control bit is set to:

[0054] DSPI_LOCK=1, DREAD_LOCK=1,

[0055] Or, DSPI_LOCK=0, DREAD_LOCK=0.

[0056] In this read operation mode, DI_PAD is the input port, after se...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an emulation validation method of a reading operation function of a memory. The method comprises the following steps of: acquiring an emulation memory, wherein the emulation memory has a control bit which sets a reading operation mode; reading a default of the reading operation mode control bit, and carrying out emulation validation on the memory by using a first reading operation mode which is preset for the reading operation mode control bit, wherein the default is a logic value which represents an erased state of a memory unit; carrying out bit-by-bit changing on the reading operation mode control bit into the logic value which represents the erased state of the memory unit; and carrying out emulation validation on the memory by respectively using the other corresponding reading operation modes for each changed reading operation mode control bit. By the method, emulation validation time for the function of the memory is reduced, and emulation validation efficiency using a virtual memory is improved on the basis that an emulation validation result can be guaranteed.

Description

technical field [0001] The invention relates to the field of chip technology, in particular to a method for emulating and verifying memory read operation functions. Background technique [0002] In the process of developing, designing and debugging the memory, it is necessary to simulate and verify the function of the memory. The simulation verification of the memory function can be carried out by using a behavioral model (that is, a virtual memory) that can replace the actual memory hardware function, specifically by generating a test code (testbench) and using simulation software (such as NC_verilog software or modelsim software). [0003] The simulation verification of the virtual memory function is essentially the same as the simulation verification of the actual memory. Taking the simulation verification of a read operation on a virtual flash memory (Flash Memory) as an example, the current read operation methods of flash memory mainly include: 1) Read data (single-cha...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06F9/455G06F11/36
Inventor 舒清明涂美红胡洪
Owner GIGADEVICE SEMICON SHANGHAI INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com