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Particle-size measuring instrument

A measuring instrument and particle technology, applied in the direction of measuring device, particle size analysis, particle and sedimentation analysis, etc., can solve the problems of undetectable, small Brownian motion, etc., achieve the effect of expanding the structure and meeting the requirements of wide range particle size distribution measurement

Inactive Publication Date: 2012-12-12
UNIV OF SHANGHAI FOR SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the particles are larger, the Brownian motion is too small to be detected, so the particle size can no longer be measured by this method

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] A multi-method fusion particle size analyzer, consisting of figure 1 As shown, the particle size analyzer consists of a laser light source 1, a non-monochromatic lighting source (2, 3), a microscope objective lens 4, a half-transparent mirror 6, an area array digital camera or video camera 7, and a sample cell (8, 5) Combined with the lens 9 to form a two-light path structure, one path is that the light emitted from the first non-monochromatic illumination source 2 irradiates the sample in the first sample pool 8, and the first sample pool 8 is located on the observation surface of the microscope objective lens 4 , the microscopic objective lens 4 passes the enlarged image to the area array digital camera or video camera 7 through the half-transparent mirror 6; The enlarged image passes through the half mirror 6 to the area array digital camera or video camera 7;

[0030] When measuring by the image method, the first non-monochromatic illumination light source 2 place...

Embodiment 2

[0034] like figure 2 As shown, in this embodiment, the second sample cell 5 for light scattering measurement is located between the lens 9 and the half mirror 6 . Others are the same as embodiment 1. Such an optical path arrangement can reduce the volume of the instrument, and when the static light scattering method is used to measure particles, larger particles can be measured.

Embodiment 3

[0036] like image 3 As shown, in this embodiment, the sample cell is a sample cell 8, the half-mirror 6 is arranged below the sample cell 8, and the laser light source 1 and the non-monochromatic illumination light source 2 are respectively arranged on the half-mirror On both sides of 6, only one microscopic objective lens 4 is used, and the image of the particles and the scattered light signal are all received by the area array digital camera or video camera 7 to realize image measurement, static light scattering measurement and dynamic light scattering measurement.

[0037] In the above embodiments, light emitting diodes or light bulbs are used as non-monochromatic lighting sources. Area scan digital cameras are CCD or CMOS digital cameras.

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Abstract

The invention discloses a particle-size measuring instrument. A laser light source, chromatic light illuminating light sources, a micro-objective lens, a semi-transparent and semi-reflecting mirror, an area array digital camera or a video camera, sample cells and a lens are combined into two light-path structures; in one light-path structure, light emitted from the first chromatic light illuminating light source irradiates on a sample in the first sample cell, an image magnified by the micro-objective lens is reflected to the area array digital camera or the video camera through the semi-transparent and semi-reflecting mirror; and in the other light-path structure, light emitted from the laser light source irradiates on a sample in the second sample cell, an image magnified by the micro-objective lens is reflected to the area array digital camera or the video camera through the semi-transparent and semi-reflecting mirror. The invention has the beneficial effects that various measuringmethods are integrated by utilizing the same digital camera, the upper and the lower limits for particle-size measurement of the particle-size measuring instrument are broadened by using a simple structure, so that the measurement range based on the particle-size measuring instrument disclosed by the invention can be from nanometer order to several-hundred micron order to meet the requirements for measurement of wide-range particle size distribution, and topography parameters of particles can be given by way of an image method.

Description

technical field [0001] The invention relates to a particle size measuring device which combines an image method and a light scattering method, in particular to a particle size measuring instrument whose measurement range can be from nanometer, submicron to micron. Background technique [0002] In recent years, with the development of CCD and CMOS digital cameras, image-based particle size analyzers that use digital cameras instead of eyepieces on traditional microscopes have been widely used. Limited by the theoretical image resolution of the optical microscope, the measurement lower limit of the image-based particle size analyzer is generally above 0.5 microns, and the upper limit can be determined according to the magnification of the microscope objective lens used. The dynamic light scattering particle size analyzer is mainly used for the particle size measurement of nanoparticles. Generally, the lower limit of measurement is about 1 nanometer, and the upper limit is 3-5 ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N15/02
Inventor 蔡小舒苏明旭
Owner UNIV OF SHANGHAI FOR SCI & TECH
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