Method of fluorescent plate electron beam imaging system for calibrating electric power response of high energy electron beam
A technology of high-energy electron beam and electron beam imaging, applied in the direction of electrical excitation analysis, material excitation analysis, etc., can solve the problem of not having electron beam accelerator, and achieve the effect of maintaining stability
Inactive Publication Date: 2013-05-08
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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This calibration method needs to move the entire fluorescent plate electron beam imaging system to the output end of the existing stable electron beam accelerator with known parameters, but this is not available in many laboratories conducting research on laser wakefield accelerators electron beam accelerator
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[0019] Combine below figure 1 The calibration method of the present invention will be further described, but it should not limit the protection scope of the present invention.
[0020] see first figure 1 , it can be seen from the figure that the method for calibrating the electrical response of the fluorescent plate electron beam imaging system to the high-energy electron beam of the present invention comprises the following steps:
[0021] ① Press first figure 1 Setting: The electron incident surface on the fluorescent plate 3 is closely covered with a layer of electronic imaging plate 4, an aluminum plate 2 is arranged before the fluorescent plate 3 and the electronic imaging plate 4, and behind the fluorescent plate 3 and the electronic imaging plate 4 A CCD detector 6 with a lens 5 is provided;
[0022] ② Simultaneously irradiating the electron beam with high energy and large divergence angle to be measured at the junction of the electronic imaging plate 4 and the fluor...
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The invention discloses a method of a fluorescent plate electron beam imaging system for calibrating the electric power response of high energy electron beam. The method comprises the steps of: covering an electron incident surface of a fluorescent plate of the imaging system with an electronic imaging plate, filtering out low energy electrons in a high-energy large-divergence angle electron beamwith continuously distributed spectra through an aluminum plate, and simultaneously irradiating the electron beam on the electronic imaging plate and the fluorescent plate, recording, by a CCD (Charge-Coupled Device) detector, the count values of the electron beam traveling a same area on the electronic imaging plate and on the fluorescent plate; and acquiring the information of the electric power through the known electronic imaging plate in order to determine the corresponding relation between the count value of the fluorescent plate and the electric power. By using the method, simple electric power response calibration can be performed on the fluorescent plate electron beam imaging system in a laser wakefield acceleration experiment without requiring a standard electron beam source.
Description
technical field [0001] The invention relates to a method for calibrating the electrical response of a high-energy electron beam to a fluorescent plate electron beam imaging system composed of a fluorescent plate, an area charge coupled device (hereinafter referred to as CCD) and a lens. Background technique [0002] Electron imaging plates are commonly used for low repetition rate, high dynamic response imaging measurements of high-energy electron beams in laser wakefield electron acceleration studies [see 1: Kazuo A. Tanakal, Toshinori Yabuuchi, Takashi Sato, Ryosuke Kodama, Yoneyoshi Kitagawa, Teruyoshi Takahashi, Toshiji Ikeda, Yoshihide Honda, and Shuuichi Okuda, "Calibration of imaging plate for high energy electron spectrometer", Rev.Sci.Instrum.76, 013507(2005).], while high repetition rate imaging measurements were made using fluorescent plates, Phosphor plate electron beam imaging system composed of CCD and lens etc. class laser-plasma-based accelerators", Rev. Sci...
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IPC IPC(8): G01N21/66
Inventor 夏长权刘建胜邓爱华徐建彩王文涛卢海洋王成徐至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI