Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Data clustering-based robust scale invariant feature transform (SIFT) feature matching method

A feature matching and data clustering technology, which is applied in the direction of instruments, character and pattern recognition, computer components, etc., can solve the problems of reduced matching robustness and inability to solve the problem of SIFT feature noise sensitivity, so as to reduce the amount of data and improve Robustness, efficiency-enhancing effects

Inactive Publication Date: 2013-04-24
BEIHANG UNIV
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, as the amount of data increases, this method also has the problem of reduced matching robustness.
Recently, Dong et al. proposed a two-stage matching method based on the vocabulary tree. This method first finds the key image through the vocabulary tree, and then uses the key image to perform feature matching between the two images, effectively avoiding the feature matching under the condition of a large amount of data. The problem of reduced matching robustness, but this method is essentially a feature matching between two images, and still cannot solve the problem of SIFT feature noise sensitivity

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Data clustering-based robust scale invariant feature transform (SIFT) feature matching method
  • Data clustering-based robust scale invariant feature transform (SIFT) feature matching method
  • Data clustering-based robust scale invariant feature transform (SIFT) feature matching method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] Table 1 has provided concrete steps of the present invention:

[0021]

[0022]

[0023] Table 1

[0024] 1. Synthetic k-d data structure construction and feature clustering in the offline stage

[0025] figure 1 A schematic diagram of the synthetic k-d data structure is given.

[0026] In the offline stage, the reference image SIFT feature set is obtained first, and all reference image SIFT feature sets are clustered. In the feature clustering method, common features are obtained directly from the image by the SIFT algorithm, which can be denoted as F s ={b i , d d}, where b i is the subordinate image, d d is a feature descriptor. The clustering feature is a collection of common features, denoted as F c ={F ss , d md}, where F ss is the general feature set, d md is the cluster average descriptor, its value is: where k is the number of common features included in the clustering feature, (d d ) i is the i-th common feature descriptor. This value i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a data clustering-based robust scale invariant feature transform (SIFT) feature matching method, which comprises the following steps of: (1) acquiring reference image sequences, extracting SIFT feature sets, clustering all the SIFT feature sets by adopting a synthetic k-d data structure, and merging the repeated feature sets as clustering features, wherein the feature descriptors of the clustering features are expressed by adopting repeated feature average descriptors; (2) acquiring real-time image sequence feature sets by using an SIFT method, performing robust matching on the reference image sequences and the real-time image sequences, and selecting the corresponding reference image with maximum feature points as a key image to complete feature matching of a first stage; and (3) completing feature matching of a second stage by using the key image, removing exterior points by adopting the technologies of random sampling consistency (RANSAC), basic matrix and the like, and finally merging the feature matching results of the two stages. According to the matching method, the noise information interference can be reduced, and the robustness of feature matchingis greatly improved.

Description

technical field [0001] The invention belongs to the technical field of computer augmented reality, and specifically performs robust matching on a SIFT feature set under the condition of a large amount of data, eliminates the influence of noise in the matching process, and improves the robustness of feature matching. Background technique [0002] SIFT feature matching technology is an important research content in computer image and vision, and has been widely used in many fields such as image retrieval, target recognition, 3D reconstruction and camera pose recovery. [0003] By treating SIFT feature descriptors as Cartesian coordinates in high-dimensional Euclidean space and using Euclidean distance as a similarity measure, the SIFT feature matching problem can be transformed into a query problem of the nearest geometric points in Euclidean space. As one of the most important branch and bound methods, the k-d data structure can effectively realize spatial division and is wid...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/62
Inventor 范志强沈旭昆赵沁平
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products