Data clustering-based robust scale invariant feature transform (SIFT) feature matching method
A feature matching and data clustering technology, which is applied in the direction of instruments, character and pattern recognition, computer components, etc., can solve the problems of reduced matching robustness and inability to solve the problem of SIFT feature noise sensitivity, so as to reduce the amount of data and improve Robustness, efficiency-enhancing effects
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0020] Table 1 has provided concrete steps of the present invention:
[0021]
[0022]
[0023] Table 1
[0024] 1. Synthetic k-d data structure construction and feature clustering in the offline stage
[0025] figure 1 A schematic diagram of the synthetic k-d data structure is given.
[0026] In the offline stage, the reference image SIFT feature set is obtained first, and all reference image SIFT feature sets are clustered. In the feature clustering method, common features are obtained directly from the image by the SIFT algorithm, which can be denoted as F s ={b i , d d}, where b i is the subordinate image, d d is a feature descriptor. The clustering feature is a collection of common features, denoted as F c ={F ss , d md}, where F ss is the general feature set, d md is the cluster average descriptor, its value is: where k is the number of common features included in the clustering feature, (d d ) i is the i-th common feature descriptor. This value i...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com