Unlock instant, AI-driven research and patent intelligence for your innovation.

Technique for interconnecting integrated circuits

A technology of integrated circuits and circuits, applied in circuits, electrical components, electrical solid devices, etc., and can solve problems such as limitations

Active Publication Date: 2013-09-11
NXP USA INC
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The ability to combine multiple functions on a single die is still limited, so the problems associated with multiple dies remain

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Technique for interconnecting integrated circuits
  • Technique for interconnecting integrated circuits
  • Technique for interconnecting integrated circuits

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0016] In one aspect, two integrated circuit dies, each having a processing core and on-board memory, are interconnected and packaged together to form a multi-chip module. The first die is considered primary and the second die is considered secondary. They are connected together through an intermediate substrate. The first and second die may have the same design and thus the same resources such as peripherals and memory, and preferably have a common system interconnect protocol. The core of the second die is disabled during most of the operation or at least placed in a reduced power mode as needed. The first die includes minimal circuitry for interconnecting with the second die. The second die has at least some required interface circuitry and address translators. The result is that the cores of the first die are able to perform transactions with respect to the memory and other resources of the second integrated circuit as if the memory and other resources were on the first...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

Two integrated circuit dies (12, 14) each having a processing core (20, 48) and onboard memory (30, 32, 60, 62) are interconnected and packaged together to form a multi-chip module (10) . The first die (12) is considered primary and the second die (14) is considered secondary, and they are connected by an interposer (16). The first and second die may have the same design and thus the same resources such as peripheral components (28, 56) and memory and preferably have a common system interconnect protocol. The core of the second die is disabled or at least placed in a reduced power mode. The first die includes minimal circuitry (34, 26) for interconnecting with the second die. The second die has some required interface circuitry (52) and address translator (50). The result is that the cores of the first die are able to perform transactions with respect to the memory and other resources of the second integrated circuit as if the memory and other resources were on the first die.

Description

technical field [0001] This application relates to integrated circuits, and more particularly to the interconnection of integrated circuits. Background technique [0002] There have been many reasons for interconnecting multiple integrated circuit dies to form a single packaged device. One use is to add memory to a given package. Another use is to join two dies that are normally used together but are difficult to make using a process that works for both. An example is logic circuits and RF circuits used in mobile phones. Sometimes there are interconnect issues or interference issues that must be addressed. Sometimes in any case there is a problem to be solved due to the particular combination of dies being implemented. Regardless of the reason for the bonding of multiple dies, there are problems that arise to overcome the need to have multiple dies. The ability to combine multiple functions on a single die is still limited, and thus the problems associated with multiple...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/48H01L23/12
CPCH01L23/3128H01L25/0657H01L25/18H01L2224/48091H01L2225/06517H01L2225/06572H01L2924/1532H01L2924/181H01L2224/16227H01L2224/16235H01L2224/73253H01L2924/15192H01L2924/15311H01L2924/18161H01L2924/19107H01L2924/00014H01L2924/00012G11C5/06G11C7/10H01L23/52H01L23/48
Inventor G·L·米勒R·W·斯坦斯
Owner NXP USA INC
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More