Platform and method for automatically generating design schematic diagram of automatic test system

A technology of automatic test system and design principle, applied in computing, electrical digital data processing, special data processing applications, etc., to achieve the effect of efficient connection, easy maintenance, fast automatic layout

Inactive Publication Date: 2011-10-19
BEIHANG UNIV
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  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to overcome the deficiencies in the means of manually drawing design schematic diagrams in the

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  • Platform and method for automatically generating design schematic diagram of automatic test system
  • Platform and method for automatically generating design schematic diagram of automatic test system
  • Platform and method for automatically generating design schematic diagram of automatic test system

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Embodiment Construction

[0024] The present invention will be further described in detail below with reference to the drawings and embodiments.

[0025] The present invention is an automatic generation platform for automatic test system design schematic diagram, such as figure 1 As shown, including input module 1, database module 2, database management module 3, parameter selection and preprocessing module 4, automatic layout module 5, automatic wiring module 6 and drawing result display and storage module 7 of the relationship between instrument equipment resources and connection constraints .

[0026] The input module 1 of the relationship between instrument equipment resources and connection constraints is the entrance to the automatic generation platform of the design schematic diagram. The user inputs data through the input module 1 of the relationship between instrument equipment resources and connection constraints. The input data includes: instrument information, signal type, and instrument connecti...

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Abstract

The invention discloses a platform and method for automatically generating a design schematic diagram of an automatic test system, wherein the platform comprises an input module for instrument device resource and connection constraint relationship, a database module, a database management module, a parameter selection and pre-processing module, an automatic layout module, an automatic routing module, as well as a drawing result display and storage module. A user inputs data via the input module for instrument device resource and connection constraint relationship; the parameter selection and pre-processing module is used for grouping and grading instruments according to the parameters selected by the user; the automatic layout module is used for performing an automatic layout operation; and the automatic routing module is used for finishing a routing operation. The method disclosed by the invention is mainly provided for finishing an automatic layout based on a method of intersecting the fewest lines, and finishing the connection among instrument ports by applying a target-oriented line search routing algorithm according to the selection of information types by the user. The platform and the method disclosed by the invention can realize rapid and efficient layout of the instrument model, and satisfy the drawing demand of the design schematic diagram in actual application.

Description

Technical field [0001] The invention belongs to the technical field of automatic testing, and specifically relates to a platform and a method for automatically generating a design schematic diagram of an automatic testing system. Background technique [0002] Usually the computer-centered, under the control of program control instructions, can automatically complete a certain test task and combine the organic whole of measuring instruments and other equipment called Automatic Test System (ATS). Various equipments in the automatic test system are programmable, and are called Automatic Test Equipment (ATE). In recent years, the automatic test system is developing in the direction of openness, generalization and modularization. The rapid development of automatic test system puts forward higher requirements for the automatic design of automatic test system. However, the hardware design as an important part of the system design is still in the manual design stage. Among them, the m...

Claims

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Application Information

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IPC IPC(8): G06F17/50
Inventor 路辉牛瑞瑶白鹤
Owner BEIHANG UNIV
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