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Analog device of external synchronous time-delayed-integration charge coupled device

A technology of charge-coupled devices and analog devices, applied in the field of TDI CCD, which can solve problems such as complex process, device damage, and unsuitable application environment

Inactive Publication Date: 2013-06-05
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In scientific research tasks, due to the requirements of performance and indicators, it is often necessary to customize a new type of TDI CCD, which requires a certain development cycle and delivery cycle, sometimes as long as one to two years, which will seriously affect the progress of scientific research and production tasks. In addition, the cost of TDI CCD is often high, and the process is complicated. Some new TDI CCDs have very complicated driving requirements, and often use multiple power supplies to supply power together, and the power supply sequence must meet a certain sequence. If the requirements are not met, or If the protection is not good, it is easy to cause damage to the device and cause huge losses, which often happens during the debugging stage of the circuit
[0003] At present, the industry has begun to design various TDI CCD waveform generators to solve the problem of test substitutes, but they are all complete simulations of the electrical performance of TDI CCDs, because of their complex structure, high cost, and large volume. in actual application environment

Method used

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  • Analog device of external synchronous time-delayed-integration charge coupled device
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  • Analog device of external synchronous time-delayed-integration charge coupled device

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Embodiment Construction

[0020] by figure 1 As shown, the external synchronous integral delay charge coupled device simulation device includes: a pin electrical characteristic simulation circuit, a drive characteristic extraction circuit, an OS signal synthesis circuit, a delay characteristic control circuit, a sensitivity control circuit, and an integral series control Circuit; the pin electrical characteristic simulation circuit receives external signals and transmits the signal to the drive characteristic extraction circuit; the delay characteristic control circuit sends signals to the drive characteristic extraction circuit; the drive characteristic extraction circuit receives the pin electrical characteristic simulation circuit and the delay characteristic control circuit Send the signal and transmit the signal to the OS signal synthesis circuit; the sensitivity control circuit and the integration level control circuit send signals to the OS signal synthesis circuit; the OS signal synthesis circuit ...

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Abstract

The invention discloses an analog device of an external synchronous time-delayed-integration charge coupled device (TDI CCD), which belongs to the field of TDI CCDs. The device comprises a pin electrical characteristic analog circuit, a drive characteristic extraction circuit, an OS (Operating System) signal synthesis circuit, a delay characteristic control circuit, a light sensitivity control circuit and an integration series control circuit. By adopting the analog device, the analog of actual TDI CCD contour dimension, input / output pin electrical characteristics, output video signals and light sensitivity characteristics are realized. The analog of a TDI CCD signal is realized by applying the external synchronous theory, thus the actual contour size of the device is equivalent to the contour size of the TDI CCD, and the analog device has the characteristics of simple structure and low cost and can completely replace the actual TDI CCD to finish various experiment works.

Description

Technical field [0001] The invention belongs to the field of TDI CCD (Time Delay and Intergration Charge-Couple Device), and in particular relates to an externally synchronized TDI CCD analog device. Background technique [0002] TDI CCD has the outstanding feature that it can obtain high sensitivity without sacrificing spatial resolution and working speed, making it have a wide range of application prospects in high-speed and low-light fields. In scientific research tasks, due to performance and index requirements, it is often necessary to customize new TDI CCDs. This requires a certain development and supply cycle, sometimes even as long as one to two years, which will seriously affect the progress of scientific research and production tasks. In addition, the cost of TDI CCD is often high, and the process is complicated. Some new TDI CCDs have complex drive requirements. They often use multiple power supplies together, and the power supply sequence must meet a certain sequence....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04N5/372
Inventor 刘辉马天波李云飞郭永飞
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI