Method for nondestructively detecting and evaluating mass defect level of high-voltage ceramic capacitors

Abstract

The invention relates to a method for nondestructively detecting and evaluating the mass defect level of high-voltage ceramic capacitors. The method provided by the invention comprises the following steps: 1) sampling high-voltage ceramic capacitors in the same batch and numbering the extracted high-voltage ceramic capacitor samples according to a sequence from No. 1 to No. n; 2) sequentially combining the high-voltage ceramic capacitor samples pairwires, namely combining No. 1 and No. 2, combining No. 2 and No. 3, till combining No. (n-1) and No. n, and combining No. n and No. 1; 3) under the condition that the externally-applied voltage does not exceed rated voltage, carrying out a ratio test of insulation resistance on the high-voltage ceramic capacitor samples combined pairwise; 4) taking a natural logarithm of the ratio test of the insulation resistance obtained in the step 3) according to a formula and using the natural logarithm as an independent variable xi to carry out probability statistic analysis; 5) computing the obtained independent variable xi according to the formula to obtain a standard variance S; and 6) evaluating the standard variance S obtained in the step 5).

Description

technical field [0001] The invention relates to a non-destructive detection and evaluation method for the quality defect level of the same batch of Class II high-voltage ceramic capacitors, in particular to a non-destructive detection and evaluation method for the quality defect level of the Class II high-voltage ceramic capacitors at two terminals. Background technique [0002] High-voltage ceramic capacitors are widely used in power equipment, such as commonly used to improve the voltage distribution between the breakers of circuit breakers or between arrester valves; high-voltage ceramic capacitors are also widely used in pulse power technology, such as commonly used in voltage doubling circuits of high-voltage power supplies. The use of defective high-voltage ceramic capacitors can greatly reduce the reliability and safety of equipment. However, due to the limitations of the manufacturing process, various defects will randomly appear in some high-voltage ceramic capacito...

AI Technical Summary

Problems solved by technology

However, this method is an identification test, and the test period is long, which cannot meet the simple and fast test requirements.

Moreover, it will cause damage to high-voltage ceramic capacitors during the test, so it is not suitable for manufacturers or users to perform non-destructive testing and evaluation of quality defect levels on high-voltage ceramic capacitors.

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