Platform for testing performance of camera based on EMVA1288 standard

A test platform and camera technology, applied in optics, instruments, photography, etc., can solve the problems of complex test system structure and scarce camera performance test platforms, and achieve the effect of convenient use

Active Publication Date: 2011-11-23
深圳市凌云视迅科技有限责任公司
View PDF1 Cites 27 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention aims at the problem that the camera performance test platform based on the EMVA1288 standard is rare and the existing test system has a complex structure, and provides a new camera performance test platform based on the EMVA1288 standard, which can test all parameters specified in the EMVA1288 standard. It also has the advantages of simple structure and low cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Platform for testing performance of camera based on EMVA1288 standard
  • Platform for testing performance of camera based on EMVA1288 standard
  • Platform for testing performance of camera based on EMVA1288 standard

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The present invention will be described below in conjunction with the accompanying drawings.

[0027] The invention discloses a camera performance testing platform based on the EMVA1288 standard, which is used for performing a performance test on a camera under test (CCD area array camera 6), figure 1 , figure 2 and image 3 The three-dimensional, top view and front view structure schematic diagrams of the test platform are respectively. This test platform complies with EMVA1288 standard, and this test platform comprises integrating sphere 1, camera obscura 11 and computer control system ( figure 1 Not shown), the integrating sphere 1 includes the light exit hole 2, and the light entrance hole is provided on the dark box 11, and the light entrance hole matches the light exit hole 2. In this embodiment, the integrating sphere 1 is arranged on the outside of the dark box 11, and the integrating sphere 1 is arranged inside the dark box 11, and the optical filter 3, the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a platform for testing performance of a camera based on an EMVA1288 standard. The method is used for testing the performance of the camera to be tested. The platform comprises an integrating sphere, a camera obscure, an optical power meter arranged in the camera obscure, a computer control system and a bracket, wherein a light inlet hole is formed in the camera obscure; the light inlet hole is matched with a light outlet hole of the integrating sphere; a double-dick filtering component and the camera to be tested are sequentially arranged in the camera obscure along an optical shaft direction of the light outlet hole of the integrating sphere; the double-dick filtering component comprises an optical filter and an attenuation sheet; the optical power meter is positioned between the double-dick filtering component and the camera to be tested and is far away from the optical shaft; the optical filter, the attenuation sheet, the optical power meter and the camera to be tested are arranged on the bracket and are connected with the computer control system; the computer control system calculates and processes attenuation values of light intensity and brightness, and the light power data monitored in real time so as to obtain the performance parameters of the camera to be tested specified in the EMVA1288 standard. The testing platform can test all the parameters specified in the EMVA1288 standard, and is simple in structure and low in cost.

Description

technical field [0001] The invention relates to the technical field of camera performance testing, in particular to a camera performance testing platform based on the EMVA1288 standard. Background technique [0002] EMVA1288 is the No. 1288 standard product catalog table published by the European Machine Vision Association (EMVA). It is a set of standards for calibrating the characteristics and performance data of image sensors and cameras for machine vision applications. [0003] Before the appearance of EMVA1288, there was no unified standard for image sensor and camera performance testing. Large manufacturers such as KODAK, DALSA, and SONY each have their own set of evaluation and testing standards. Some indicators have the same definition, and many indicators have different definitions. Therefore, it is difficult to compare the horizontal performance of image sensors and cameras from different manufacturers. In order to compare the horizontal performance of image sensor...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G03B43/00
Inventor 冯兵杨艺陈玉兰赵严张勇
Owner 深圳市凌云视迅科技有限责任公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap